TY - JOUR
T1 - Minimizing thermally induced interfacial shearing stress in a thermoelectric module with low fractional area coverage
AU - Ziabari, Amirkoushyar
AU - Suhir, Ephraim
AU - Shakouri, Ali
PY - 2014/5
Y1 - 2014/5
N2 - High temperature differences between the ceramic parts in thermo-electric modules (TEMs) intended for high temperature applications makes the TEMs vulnerable to the elevated thermal stress leading to possible structural (mechanical) failures. The problem of reducing the interfacial shearing stress in a TEM structure is addressed using analytical and finite-element-analysis (FEA) modeling. The maximum shearing stress occurring at the ends of the peripheral legs (and supposedly responsible for the structural robustness of the assembly) is calculated for different leg sizes. Good agreement between the analytical and FEA predictions has been found. It is concluded that the shearing stress can be effectively reduced by using thinner (smaller fractional area coverage) and longer (in the through thickness direction of the module) legs and compliant interfacial materials.
AB - High temperature differences between the ceramic parts in thermo-electric modules (TEMs) intended for high temperature applications makes the TEMs vulnerable to the elevated thermal stress leading to possible structural (mechanical) failures. The problem of reducing the interfacial shearing stress in a TEM structure is addressed using analytical and finite-element-analysis (FEA) modeling. The maximum shearing stress occurring at the ends of the peripheral legs (and supposedly responsible for the structural robustness of the assembly) is calculated for different leg sizes. Good agreement between the analytical and FEA predictions has been found. It is concluded that the shearing stress can be effectively reduced by using thinner (smaller fractional area coverage) and longer (in the through thickness direction of the module) legs and compliant interfacial materials.
KW - Analytical modeling
KW - Finite element method
KW - Interfacial stress
KW - Thermal stress
KW - Thermo-electric module
UR - http://www.scopus.com/inward/record.url?scp=84901194469&partnerID=8YFLogxK
U2 - 10.1016/j.mejo.2013.12.004
DO - 10.1016/j.mejo.2013.12.004
M3 - Article
AN - SCOPUS:84901194469
SN - 0026-2692
VL - 45
SP - 547
EP - 553
JO - Microelectronics Journal
JF - Microelectronics Journal
IS - 5
ER -