Microstructural characterization of silicon nitride ceramics processed by pressureless sintering, overpressure sintering, and sinter HIP

K. R. Selkregg, K. L. More, S. G. Seshadri, C. H. McMurty

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

Silicon nitride ceramics of the same nominal sialon composition have been sintered under different conditions including atmospheric sintering, overpressure sintering, reaction-bonded (nitrided pressureless sinter), and sinter/HIP cycles. The sintered ceramics, which exhibited dramatic differences in fracture toughness, have been characterized by X-ray diffraction, scanning electron microscopy, analytical transmission electron microscopy, and image analysis techniques. Fracture toughness data have been correlated to the microstructural and chemical analysis of the grain-boundary phases. The microstructure was the strongest influecing factor on the observed fracture-toughness difference.

Original languageEnglish
Pages (from-to)603-615
Number of pages13
JournalCeramic Engineering and Science Proceedings
Volume11
Issue number7 -8 pt 1
StatePublished - Jul 1990
Externally publishedYes
EventFourteenth Annual Conference on Composites and Advanced Ceramic Materials - Cocoa Beach, FL, USA
Duration: Jan 14 1990Jan 17 1990

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