TY - GEN
T1 - Microstructural analysis of secondary phases in silicon carbide fabricated with SiC nano-powder and sintering additives
AU - Koyanagi, Takaaki
AU - Kondo, Sosuke
AU - Hinoki, Tatsuya
PY - 2011
Y1 - 2011
N2 - Chemical composition, structure and distribution of secondary phases in two kinds of monolithic SiC ceramics fabricated by liquid phase sintering with SiC nano-powder and 6 or 9 wt.% sintering additives of Al2O3 and Y2O3 were investigated. The major secondary phase in both samples was identified as crystalline yttrium aluminum garnet (YAG) by XRD pattern. EPMA-WDS analysis revealed that the sample containing 9 wt.% additives had the relatively distinct Y-rich and Al-rich regions, by contrast with relatively-homogeneous distribution of the additives elements in the sample containing 6 wt.% additives. The dominating secondary phases at triple junctions of YAG for Y-rich regions and Al2O3 for Al-rich regions in SiC (9 wt.% additives) were identified by TEM-EELS analysis. In SiC (6 wt.% additives), the dominating YAG was observed at triple junctions. High-resolution TEM revealed that amorphous films with content Y, Al and O existed at both the SiC-SiC and SiC-YAG grain boundaries.
AB - Chemical composition, structure and distribution of secondary phases in two kinds of monolithic SiC ceramics fabricated by liquid phase sintering with SiC nano-powder and 6 or 9 wt.% sintering additives of Al2O3 and Y2O3 were investigated. The major secondary phase in both samples was identified as crystalline yttrium aluminum garnet (YAG) by XRD pattern. EPMA-WDS analysis revealed that the sample containing 9 wt.% additives had the relatively distinct Y-rich and Al-rich regions, by contrast with relatively-homogeneous distribution of the additives elements in the sample containing 6 wt.% additives. The dominating secondary phases at triple junctions of YAG for Y-rich regions and Al2O3 for Al-rich regions in SiC (9 wt.% additives) were identified by TEM-EELS analysis. In SiC (6 wt.% additives), the dominating YAG was observed at triple junctions. High-resolution TEM revealed that amorphous films with content Y, Al and O existed at both the SiC-SiC and SiC-YAG grain boundaries.
UR - http://www.scopus.com/inward/record.url?scp=80155136987&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:80155136987
SN - 9781118059944
T3 - Ceramic Engineering and Science Proceedings
SP - 53
EP - 61
BT - Ceramic Materials for Energy Applications - A Collection of Papers Presented at the 35th International Conference on Advanced Ceramics and Composites, ICACC
T2 - Ceramic Materials for Energy Applications - 35th International Conference on Advanced Ceramics and Composites, ICACC
Y2 - 23 January 2011 through 28 January 2011
ER -