Microscopic origin of black spot defect swelling in single crystal 3C-SiC

Ka Yu Fung, Yan Ru Lin, Pei Jun Yu, Ji Jung Kai, Alice Hu

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

In this study, we perform a series of simulation of a high-energy particle irradiation on a 3C-SiC at low temperature through molecular dynamic analysis. In order to determine the formation mechanism of black spot defects (BSD), the evolution of defect clusters during the cascade process is examined. Simulation results show that there are more isolated interstitials scattering across the structure while the less mobile vacancies are concentrated in defect clusters, which is consistent with the depleted zone theory proposed by Brinkman [3]. These results also match the TEM observation and simulation results done by Lin et al. [4] and support the argument that black spot defects are in fact vacancy-rich regions, with individual interstitials spreading into bulk, stretching the lattice structure.

Original languageEnglish
Pages (from-to)292-298
Number of pages7
JournalJournal of Nuclear Materials
Volume508
DOIs
StatePublished - Sep 2018
Externally publishedYes

Funding

Authors would like to thank advice from Dr Samolyuk for simulation setting. AH acknowledges financial support provided by the City University of Hong Kong (Grant No. 9610336 ), National Natural Science Foundation of China (Grant No. 11605148 ), and Hong Kong Research Grants Council (RGC) General Research Funds (GRF) No. CityU 21202517 and Tianhe-2 supercomputing center ; JJK supported by Hong Kong Research Grants Council (RGC) General Research Funds (GRF) No. CityU 11212915 .

Keywords

  • Black spot defect
  • Irradiation swelling
  • Molecular dynamic
  • Silicon carbide

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