MICROANALYTICAL AND MICROSTRUCTURAL ANALYSES OF BORON AND ALUMINUM REGIONS IN SINTERED ALPHA SILICON CARBIDE.

R. F. Davis, J. E. Lane, C. H. Carter, J. Bentley, W. H. Wadlin, D. P. Griffis, R. W. Linton, K. L. More

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Abstract

Using a host of sophisticated analytical instruments including SIMS, AES and TEM, it has been found that commercial sintered alpha -SiC contains B//4 C particles or particles containing Al, B, C and Si, depending on the sintering aids employed, within the SiC matrix. These particles are considerably larger than the average grain size of this matrix. Furthermore at temperatures lower than the sintering temperature, much smaller precipitates of B occur within the SiC grains in the non Al-containing samples which have been deformed.

Original languageEnglish
Pages (from-to)1161-1167
Number of pages7
JournalScanning Electron Microscopy
Volumev
Issue numberpt 3 1984
StatePublished - 1984

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