Micro scale distribution of nanoparticles studied with X-ray near-field scattering

Yuya Shinohara, Teruaki Yoshii, Hiroyuki Kishimoto, Kentaro Uesugi, Yoshiyuki Amemiya

Research output: Contribution to journalArticlepeer-review

Abstract

In the present study, we investigate the micron-scale inhomogeneous distribution of silica nanoparticles with X-ray near-field scattering. This technique allows us to measure structures of soft matters on a large size scale that is complementary to conventional ultra-small-angle X-ray scattering and/or X-ray imaging. We applied the technique to the observation of the anisotropic structural distribution of silica aggregates in uniaxially stretched rubber. The scattering images show anisotropic butterfly patterns that correspond to the inhomogeneous density distribution of silica aggregates. The spatial distribution of the inhomogeneity in the stretched rubber cab also be determined by this technique.

Original languageEnglish
Pages (from-to)580-585
Number of pages6
JournalKobunshi Ronbunshu
Volume71
Issue number11
DOIs
StatePublished - 2014
Externally publishedYes

Keywords

  • Filled rubber
  • Hierarchical structure
  • XNFS

Fingerprint

Dive into the research topics of 'Micro scale distribution of nanoparticles studied with X-ray near-field scattering'. Together they form a unique fingerprint.

Cite this