Abstract
We have begun a program to develop CZT-based detectors optimized for Synchrotron Radiation (SR) applications. We have made a large number of pixellated and strip detectors with each element having a performance similar to that of individual commercial detectors. On the macroscopic scale it seems very hard to find a systematic correlation between performance and material defects, probably because of local stoichiometry variations and other local disordering. In order to understand the factors limiting the energy resolution of CZT X-ray detectors, our efforts were directed to the area of material characterization and detector testing using the National Synchrotron Light Source (NSLS). NSLS provides us with a highly collimated high intensity X-ray beam, which is employed to perform micro-scale stoichiometry measurement using the SR beam to excite fluorescence and using the characteristic line intensities to measure concentration. Micron-scale detector performance mapping is performed to measure the correlation between microscopic defects and fluctuations in collected charge.
| Original language | English |
|---|---|
| Article number | R10-4 |
| Pages (from-to) | 3503-3506 |
| Number of pages | 4 |
| Journal | IEEE Nuclear Science Symposium Conference Record |
| Volume | 5 |
| State | Published - 2003 |
| Externally published | Yes |
| Event | 2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference - Portland, OR, United States Duration: Oct 19 2003 → Oct 25 2003 |