Abstract
Artifacts induced by distortions which sometimes occur in two-dimensional projection images can appear in the resulting tomographic reconstructions. We describe a procedure for analyzing, correcting and removing experimental artifacts, and hence reducing reconstruction artifacts. Two-dimensional and three-dimensional images acquired with scanning transmission x-ray microscopy of a sample containing an integrated circuit interconnect show how these procedures can be successfully applied.
| Original language | English |
|---|---|
| Pages (from-to) | 237-245 |
| Number of pages | 9 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3772 |
| State | Published - 1999 |
| Externally published | Yes |
| Event | Proceedings of the 1999 Developments in X-Ray Tomography II - Denver, CO, USA Duration: Jul 22 1999 → Jul 23 1999 |
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