Methane penetration in DIII-D ELMing H-mode plasmas

W. P. West, C. J. Lasnier, D. G. Whyte, R. C. Isler, T. E. Evans, G. L. Jackson, D. Rudakov, M. R. Wade, J. Strachan

Research output: Contribution to journalConference articlepeer-review

9 Scopus citations

Abstract

Carbon penetration into the core plasma during midplane and divertor methane puffing has been measured for DIII-D ELMing H-mode plasmas. The methane puffs are adjusted to a measurable signal, but global plasma parameters are only weakly affected (line average density, 〈ne〉 increases by <10%, energy confinement time, τE, drops by <10%). The total carbon content is derived from C6+ density profiles in the core measured as a function of time using charge exchange recombination spectroscopy. The methane penetration factor is defined as the difference in the core content with the puff on and puff off, divided by the carbon confinement time and the methane puffing rate. In ELMing H-mode discharges with ion ∇B drift direction into the X-point, increasing the line averaged density from 5 to 8×1019 m-3 dropped the penetration factor from 6.6% to 4.6% for main chamber puffing. The penetration factor for divertor puffing was below the detection limit (<1%). Changing the ion ∇B drift to away from the X-point decreased the penteration factor by more than a factor of five for main chamber puffing.

Original languageEnglish
Pages (from-to)1211-1215
Number of pages5
JournalJournal of Nuclear Materials
Volume313-316
Issue numberSUPPL.
DOIs
StatePublished - Mar 2003
EventPlasma - Surface Interactions in Controlled Fusion Devices - Gifu, Japan
Duration: May 26 2002May 31 2002

Funding

Work supported by US Department of Energy under Contracts DE-AC03-99ER54463, W-7405-ENG-48, DE-AC05-00OR22725, DE-AC02-76CH03073, and Grant DE-FG03-95ER54294.

Keywords

  • Carbon contamination
  • Chemical sputtering
  • Impurity transport
  • Tokamak impurity sources

Fingerprint

Dive into the research topics of 'Methane penetration in DIII-D ELMing H-mode plasmas'. Together they form a unique fingerprint.

Cite this