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Melt-Quenched CsPbBr3 Perovskites with Bright Orange Defect Emission

  • Zhanpeng Wei
  • , Dongdong Li
  • , Da Liu
  • , Qing Li
  • , Yao Lv
  • , Kuan Xue
  • , Yichu Zheng
  • , Sihan Zeng
  • , Jun Xing
  • , Sheng Dai
  • , Xie Zhang
  • , Yu Hou
  • , Hua Gui Yang
  • , Shuang Yang

Research output: Contribution to journalArticlepeer-review

Abstract

Defect emission, as a fundamental phenomenon in semiconductor physics, enables multifaceted applications in solid-state lighting, anti-counterfeiting data storage, and quantum information technologies. Lead halide perovskites can accommodate native defects without nonradiative quenching of band-edge emission, yet intentionally creating and observing radiative defect centers in these materials has proved challenging. Here, we report the observation of stable defect-induced emission featuring bright orange luminance peaked at ∼601 nm and prolonged carrier lifetimes of ∼154.69 µs in cesium lead bromide perovskites. This unique behavior is achieved by the introduction of extreme residual stress through a cryogenic melt-quenching strategy. Density functional theory calculations show that strain alters the formation energy of bromine vacancies, thereby accounting for the redshifted emission and high density of radiative defects. Moreover, modulation of the quenching rate allows for deliberate engineering of the residual stress, thereby realizing the precise manipulation of the balance of band edge and defect emissions. The manifestation of defect luminescence in metal halide perovskites harbors promising prospects for innovative applications in optoelectronics, bioimaging, and solid-state qubits.

Original languageEnglish
Article numbere27020
JournalAdvanced Functional Materials
Volume36
Issue number37
DOIs
StatePublished - May 7 2026
Externally publishedYes

Funding

This work was financially supported by National Natural Science Foundation of China (22379044, 12304109), Scientific Research Innovation Capability Support Project for Young Faculty (SRICSPYF‐ZY2025085), Science and Technology Commission of Shanghai Municipality (23520710700), Key Program of the National Natural Science Foundation of China (22239001), Shanghai Pilot Program for Basic Research (22TQ1400100‐5), Shanghai Municipal Natural Science Foundation (25ZR1401081), the Fundamental Research Funds for the Central Universities (JKD01251505, JKVD1251041), Shanghai Engineering Research Center of Hierarchical Nanomaterials (18DZ2252400), and Shanghai Frontiers Science Center of Optogenetic Techniques for Cell Metabolism (Shanghai Municipal Education Commission).

Keywords

  • defect-induced luminescence
  • melt-quenching
  • residual stress engineering

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