Mechanisms of stacking fault tetrahedra destruction by gliding dislocations in quenched gold

Y. Matsukawa; Y. N. Osetsky; R. E. Stoller; S. J. Zinkle

doi:10.1080/14786430801898644

Mechanisms of stacking fault tetrahedra destruction by gliding dislocations in quenched gold

Y. Matsukawa, Y. N. Osetsky, R. E. Stoller, S. J. Zinkle

Microstructural Evolution Modeling

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56 Scopus citations

Abstract

The destruction processes of stacking fault tetrahedra (SFTs) induced by gliding dislocations were examined by transmission electron microscopy (TEM) in situ straining experiments for SFTs with edge lengths ranging from 10 to 50 nm. At least four distinct SFT destruction processes were identified: (1) consistent with a Kimura-Maddin model for both screw and 60 dislocations, (2) stress-induced SFT collapse into a triangular Frank loop, (3) partial annihilation leaving an apex portion and (4) complete annihilation. Process (4) was observed at room temperature only for small SFTs (10 nm); however, this process was also frequently observed for larger SFTs (30 nm) at higher temperature (853 K). When this process was induced, the dislocation always cross-slipped, indicating only screw dislocations can induce this process.

Original language	English
Pages (from-to)	581-597
Number of pages	17
Journal	Philosophical Magazine
Volume	88
Issue number	4
DOIs	https://doi.org/10.1080/14786430801898644
State	Published - Feb 2008

Funding

This research was sponsored by the Office of Fusion Energy Sciences, US Department of Energy, under contract DE-ACO5-00OR22725 with UT-Battelle, LLC. We thank Dr Thak Sang Byun for valuable comments.

Funders	Funder number
US Department of Energy	DE-ACO5-00OR22725
Fusion Energy Sciences

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abstract = "The destruction processes of stacking fault tetrahedra (SFTs) induced by gliding dislocations were examined by transmission electron microscopy (TEM) in situ straining experiments for SFTs with edge lengths ranging from 10 to 50 nm. At least four distinct SFT destruction processes were identified: (1) consistent with a Kimura-Maddin model for both screw and 60 dislocations, (2) stress-induced SFT collapse into a triangular Frank loop, (3) partial annihilation leaving an apex portion and (4) complete annihilation. Process (4) was observed at room temperature only for small SFTs (10 nm); however, this process was also frequently observed for larger SFTs (30 nm) at higher temperature (853 K). When this process was induced, the dislocation always cross-slipped, indicating only screw dislocations can induce this process.",

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Mechanisms of stacking fault tetrahedra destruction by gliding dislocations in quenched gold

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