Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	392-393
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	29
DOIs	https://doi.org/10.1093/micmic/ozad067.184
State	Published - Aug 1 2023

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title = "Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection",

author = "Roccapriore, \{Kevin M.\} and Maxim Ziatdinov and Riccardo Torsi and Joshua Robinson and Kalinin, \{Sergei V.\}",

year = "2023",

month = aug,

day = "1",

doi = "10.1093/micmic/ozad067.184",

language = "English",

volume = "29",

pages = "392--393",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

AU - Roccapriore, Kevin M.

AU - Ziatdinov, Maxim

AU - Torsi, Riccardo

AU - Robinson, Joshua

AU - Kalinin, Sergei V.

PY - 2023/8/1

Y1 - 2023/8/1

UR - https://www.scopus.com/pages/publications/85213712203

U2 - 10.1093/micmic/ozad067.184

DO - 10.1093/micmic/ozad067.184

M3 - Article

C2 - 37613074

AN - SCOPUS:85213712203

SN - 1431-9276

VL - 29

SP - 392

EP - 393

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -