Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection

Kevin M. Roccapriore, Maxim Ziatdinov, Riccardo Torsi, Joshua Robinson, Sergei V. Kalinin

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)392-393
Number of pages2
JournalMicroscopy and Microanalysis
Volume29
Issue number1
DOIs
StatePublished - Jul 22 2023

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