Original language | English |
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Pages (from-to) | 392-393 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 29 |
Issue number | 1 |
DOIs | |
State | Published - Jul 22 2023 |
Measuring Single Atomic Defects in 2D Materials with Off-axis EELS Using Real-time AI-driven Detection
Kevin M. Roccapriore, Maxim Ziatdinov, Riccardo Torsi, Joshua Robinson, Sergei V. Kalinin
Research output: Contribution to journal › Article › peer-review