Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures

R. C. Duckworth; J. A. Demko; M. J. Gouge; J. A. Urbahn

doi:10.1063/1.2192334

Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures

R. C. Duckworth
, J. A. Demko
, M. J. Gouge
, J. A. Urbahn

Fusion Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

An experiment has been designed, fabricated, and conducted to measure emissivity of clean and contaminated metallic surfaces at temperatures between 25 K and 35 K. Samples of silver-plated copper with a total surface area of 0.25 m² are secured to the coldhead of a single stage cryocooler and enclosed within an effective black thermal shield, which has an effective emissivity of 0.95 and temperatures between 275 K and 280 K. From error analysis, a sample with an emissivity of 0.020 had an experimental error between +/- 0.001 and +/- 0.002. From measurement of the radiation heat transfer, the emissivity at 30 K was 45% of the emissivity that was measured at 300 K for a set of silver-plated copper samples. In addition, 110 μg of water vapor was sufficient to increase the emissivity of the silver-plated copper between 50% and 200%.

Original language	English
Title of host publication	ADVANCES IN CRYOGENIC ENGINEERING
Subtitle of host publication	Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52A
Pages	61-68
Number of pages	8
DOIs	https://doi.org/10.1063/1.2192334
State	Published - Mar 31 2006
Event	ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC - Keystone, CO, United States Duration: Aug 29 2005 → Sep 2 2005

Publication series

Name	AIP Conference Proceedings
Volume	824 I
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC
Country/Territory	United States
City	Keystone, CO
Period	08/29/05 → 09/2/05

Keywords

Emissivity
Silver-plated copper
Water degradation

Access to Document

10.1063/1.2192334

Cite this

Duckworth, R. C., Demko, J. A., Gouge, M. J., & Urbahn, J. A. (2006). Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures. In ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52A (pp. 61-68). (AIP Conference Proceedings; Vol. 824 I). https://doi.org/10.1063/1.2192334

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title = "Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures",

abstract = "An experiment has been designed, fabricated, and conducted to measure emissivity of clean and contaminated metallic surfaces at temperatures between 25 K and 35 K. Samples of silver-plated copper with a total surface area of 0.25 m2 are secured to the coldhead of a single stage cryocooler and enclosed within an effective black thermal shield, which has an effective emissivity of 0.95 and temperatures between 275 K and 280 K. From error analysis, a sample with an emissivity of 0.020 had an experimental error between +/- 0.001 and +/- 0.002. From measurement of the radiation heat transfer, the emissivity at 30 K was 45\% of the emissivity that was measured at 300 K for a set of silver-plated copper samples. In addition, 110 μg of water vapor was sufficient to increase the emissivity of the silver-plated copper between 50\% and 200\%.",

keywords = "Emissivity, Silver-plated copper, Water degradation",

author = "Duckworth, \{R. C.\} and Demko, \{J. A.\} and Gouge, \{M. J.\} and Urbahn, \{J. A.\}",

year = "2006",

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language = "English",

isbn = "0735403163",

series = "AIP Conference Proceedings",

pages = "61--68",

booktitle = "ADVANCES IN CRYOGENIC ENGINEERING",

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}

Duckworth, RC, Demko, JA, Gouge, MJ & Urbahn, JA 2006, Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures. in ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52A. AIP Conference Proceedings, vol. 824 I, pp. 61-68, ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Keystone, CO, United States, 08/29/05. https://doi.org/10.1063/1.2192334

Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures. / Duckworth, R. C.; Demko, J. A.; Gouge, M. J. et al.
ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC, Volume 52A. 2006. p. 61-68 (AIP Conference Proceedings; Vol. 824 I).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Duckworth, R. C.

AU - Demko, J. A.

AU - Gouge, M. J.

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PY - 2006/3/31

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N2 - An experiment has been designed, fabricated, and conducted to measure emissivity of clean and contaminated metallic surfaces at temperatures between 25 K and 35 K. Samples of silver-plated copper with a total surface area of 0.25 m2 are secured to the coldhead of a single stage cryocooler and enclosed within an effective black thermal shield, which has an effective emissivity of 0.95 and temperatures between 275 K and 280 K. From error analysis, a sample with an emissivity of 0.020 had an experimental error between +/- 0.001 and +/- 0.002. From measurement of the radiation heat transfer, the emissivity at 30 K was 45% of the emissivity that was measured at 300 K for a set of silver-plated copper samples. In addition, 110 μg of water vapor was sufficient to increase the emissivity of the silver-plated copper between 50% and 200%.

AB - An experiment has been designed, fabricated, and conducted to measure emissivity of clean and contaminated metallic surfaces at temperatures between 25 K and 35 K. Samples of silver-plated copper with a total surface area of 0.25 m2 are secured to the coldhead of a single stage cryocooler and enclosed within an effective black thermal shield, which has an effective emissivity of 0.95 and temperatures between 275 K and 280 K. From error analysis, a sample with an emissivity of 0.020 had an experimental error between +/- 0.001 and +/- 0.002. From measurement of the radiation heat transfer, the emissivity at 30 K was 45% of the emissivity that was measured at 300 K for a set of silver-plated copper samples. In addition, 110 μg of water vapor was sufficient to increase the emissivity of the silver-plated copper between 50% and 200%.

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KW - Silver-plated copper

KW - Water degradation

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Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures

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Keywords

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