@inproceedings{8d45e7956d314a7f94051bb75e595784,
title = "Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures",
abstract = "An experiment has been designed, fabricated, and conducted to measure emissivity of clean and contaminated metallic surfaces at temperatures between 25 K and 35 K. Samples of silver-plated copper with a total surface area of 0.25 m2 are secured to the coldhead of a single stage cryocooler and enclosed within an effective black thermal shield, which has an effective emissivity of 0.95 and temperatures between 275 K and 280 K. From error analysis, a sample with an emissivity of 0.020 had an experimental error between +/- 0.001 and +/- 0.002. From measurement of the radiation heat transfer, the emissivity at 30 K was 45% of the emissivity that was measured at 300 K for a set of silver-plated copper samples. In addition, 110 μg of water vapor was sufficient to increase the emissivity of the silver-plated copper between 50% and 200%.",
keywords = "Emissivity, Silver-plated copper, Water degradation",
author = "Duckworth, {R. C.} and Demko, {J. A.} and Gouge, {M. J.} and Urbahn, {J. A.}",
year = "2006",
month = mar,
day = "31",
doi = "10.1063/1.2192334",
language = "English",
isbn = "0735403163",
series = "AIP Conference Proceedings",
pages = "61--68",
booktitle = "ADVANCES IN CRYOGENIC ENGINEERING",
note = "ADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC ; Conference date: 29-08-2005 Through 02-09-2005",
}