Measurement of the emissivity of clean and contaminated silver plated copper surfaces at cryogenic temperatures

R. C. Duckworth, J. A. Demko, M. J. Gouge, J. A. Urbahn

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

An experiment has been designed, fabricated, and conducted to measure emissivity of clean and contaminated metallic surfaces at temperatures between 25 K and 35 K. Samples of silver-plated copper with a total surface area of 0.25 m2 are secured to the coldhead of a single stage cryocooler and enclosed within an effective black thermal shield, which has an effective emissivity of 0.95 and temperatures between 275 K and 280 K. From error analysis, a sample with an emissivity of 0.020 had an experimental error between +/- 0.001 and +/- 0.002. From measurement of the radiation heat transfer, the emissivity at 30 K was 45% of the emissivity that was measured at 300 K for a set of silver-plated copper samples. In addition, 110 μg of water vapor was sufficient to increase the emissivity of the silver-plated copper between 50% and 200%.

Original languageEnglish
Title of host publicationADVANCES IN CRYOGENIC ENGINEERING
Subtitle of host publicationTransactions of the International Cryogenic Materials Conference, ICMC, Volume 52A
Pages61-68
Number of pages8
DOIs
StatePublished - Mar 31 2006
EventADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC - Keystone, CO, United States
Duration: Aug 29 2005Sep 2 2005

Publication series

NameAIP Conference Proceedings
Volume824 I
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceADVANCES IN CRYOGENIC ENGINEERING: Transactions of the International Cryogenic Materials Conference, ICMC
Country/TerritoryUnited States
CityKeystone, CO
Period08/29/0509/2/05

Keywords

  • Emissivity
  • Silver-plated copper
  • Water degradation

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