Measurement of Edge Localized Mode using Fast Camera in NSTX

NSTX Team

doi:10.1541/ieejfms.125.902

Measurement of Edge Localized Mode using Fast Camera in NSTX

NSTX Team

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

This paper describes the ELMs measurement by a fast camera in NSTX. The images obtained by the fast camera reveals the ELMs behavior near the divertor region, and the X-point movement can be seen clearly at a first time. The X-point moves inner and down during large ELM. On the other hand the X-point moves up and down during tiny ELM. The difference of these ELMs behavior is also briefly discussed.

Original language	English
Pages (from-to)	902-907
Number of pages	6
Journal	IEEJ Transactions on Fundamentals and Materials
Volume	125
Issue number	11
DOIs	https://doi.org/10.1541/ieejfms.125.902
State	Published - 2005
Externally published	Yes

Keywords

H-mode
NSTX
divertor plasma
edge localized mode
fast camera
peripheral phenomena

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1541/ieejfms.125.902

Cite this

@article{01f9eb15d3724d8bbae734ee344b86a9,

title = "Measurement of Edge Localized Mode using Fast Camera in NSTX",

abstract = "This paper describes the ELMs measurement by a fast camera in NSTX. The images obtained by the fast camera reveals the ELMs behavior near the divertor region, and the X-point movement can be seen clearly at a first time. The X-point moves inner and down during large ELM. On the other hand the X-point moves up and down during tiny ELM. The difference of these ELMs behavior is also briefly discussed.",

keywords = "H-mode, NSTX, divertor plasma, edge localized mode, fast camera, peripheral phenomena",

author = "{NSTX Team} and Nobuhiro Nishino and Lane Roquemore and Zweben, {Stewart J.} and Biewer, {Theodore M.} and Ricardo Maqueda and Rajesh Maingi and Charles Bush and Kevin Tritz and Dan Stutman",

year = "2005",

doi = "10.1541/ieejfms.125.902",

language = "English",

volume = "125",

pages = "902--907",

journal = "IEEJ Transactions on Fundamentals and Materials",

issn = "0385-4205",

number = "11",

}

TY - JOUR

T1 - Measurement of Edge Localized Mode using Fast Camera in NSTX

AU - NSTX Team

AU - Nishino, Nobuhiro

AU - Roquemore, Lane

AU - Zweben, Stewart J.

AU - Biewer, Theodore M.

AU - Maqueda, Ricardo

AU - Maingi, Rajesh

AU - Bush, Charles

AU - Tritz, Kevin

AU - Stutman, Dan

PY - 2005

Y1 - 2005

N2 - This paper describes the ELMs measurement by a fast camera in NSTX. The images obtained by the fast camera reveals the ELMs behavior near the divertor region, and the X-point movement can be seen clearly at a first time. The X-point moves inner and down during large ELM. On the other hand the X-point moves up and down during tiny ELM. The difference of these ELMs behavior is also briefly discussed.

AB - This paper describes the ELMs measurement by a fast camera in NSTX. The images obtained by the fast camera reveals the ELMs behavior near the divertor region, and the X-point movement can be seen clearly at a first time. The X-point moves inner and down during large ELM. On the other hand the X-point moves up and down during tiny ELM. The difference of these ELMs behavior is also briefly discussed.

KW - H-mode

KW - NSTX

KW - divertor plasma

KW - edge localized mode

KW - fast camera

KW - peripheral phenomena

UR - http://www.scopus.com/inward/record.url?scp=34248528562&partnerID=8YFLogxK

U2 - 10.1541/ieejfms.125.902

DO - 10.1541/ieejfms.125.902

M3 - Article

AN - SCOPUS:34248528562

SN - 0385-4205

VL - 125

SP - 902

EP - 907

JO - IEEJ Transactions on Fundamentals and Materials

JF - IEEJ Transactions on Fundamentals and Materials

IS - 11

ER -

Measurement of Edge Localized Mode using Fast Camera in NSTX

Abstract

Keywords

UN SDGs

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