TY - GEN
T1 - Maximum Likelihood Estimation of the Geometric Sensitivities in PET
AU - Rezaei, Ahmadreza
AU - Deller, Timothy
AU - Wangerin, Kristen
AU - Schramm, Georg
AU - Jansen, Floris
AU - Van Laere, Koen
AU - Nuyts, Johan
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/10
Y1 - 2019/10
N2 - In this work, we propose a maximum likelihood method to compute geometric and efficiency related corrections from PET emission data. In order to reduce the number of unknowns being estimated, a component and crystal based model is used for the geometric and efficiency based corrections, respectively. In a long acquisition of a uniform phantom scan, we show how inaccuracies in the projector or the scanner geometry can create observable artefacts in the reconstructions. Once the geometric and efficiency related corrections are re-estimated with our in-house projector the artifacts are eliminated.
AB - In this work, we propose a maximum likelihood method to compute geometric and efficiency related corrections from PET emission data. In order to reduce the number of unknowns being estimated, a component and crystal based model is used for the geometric and efficiency based corrections, respectively. In a long acquisition of a uniform phantom scan, we show how inaccuracies in the projector or the scanner geometry can create observable artefacts in the reconstructions. Once the geometric and efficiency related corrections are re-estimated with our in-house projector the artifacts are eliminated.
KW - Crystal Efficiencies
KW - Geometric Sensitivities
KW - PET
UR - http://www.scopus.com/inward/record.url?scp=85083563734&partnerID=8YFLogxK
U2 - 10.1109/NSS/MIC42101.2019.9059896
DO - 10.1109/NSS/MIC42101.2019.9059896
M3 - Conference contribution
AN - SCOPUS:85083563734
T3 - 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2019
BT - 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2019
Y2 - 26 October 2019 through 2 November 2019
ER -