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Materials characterization in the aberration-corrected scanning transmission electron microscope
M. Varela, A. R. Lupini, K. Van Benthem, A. Y. Borisevich, M. F. Chisholm, N. Shibata, E. Abe, S. J. Pennycook
Research output: Contribution to journal › Article › peer-review
200
Scopus
citations