Materials analysis using sputter initiated resonance ionization spectroscopy

J. E. Parks; D. W. Beekman; H. W. Schmitt; E. H. Taylor

doi:10.1016/0168-583X(85)90252-6

Materials analysis using sputter initiated resonance ionization spectroscopy

J. E. Parks, D. W. Beekman, H. W. Schmitt, E. H. Taylor

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15 Scopus citations

Abstract

Resonance Ionization Spectroscopy (RIS) is a sensitive and selective ionization technique capable of single atom detection. This technique has been applied to the trace element analysis of solids in a process called Sputter Initiated Resonance Ionization Spectroscopy (SIRIS). Here we briefly review RIS and SIRIS. Recent results are presented for measurements of boron concentrations down to the ppm level in standard steel and silicon samples. Some preliminary results are also presented for uranium and uranium compounds. A detection efficiency for SIRIS is reported which will make possible a sensitivity of 2 ppb.

Original language	English
Pages (from-to)	280-284
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	10-11
Issue number	PART 1
DOIs	https://doi.org/10.1016/0168-583X(85)90252-6
State	Published - May 15 1985
Externally published	Yes

Funding

The partial support of this work by the Nuclear Regulatory Commission is gratefully acknowledged.

Funders	Funder number
U.S. Nuclear Regulatory Commission

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10.1016/0168-583X(85)90252-6

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AU - Parks, J. E.

AU - Beekman, D. W.

AU - Schmitt, H. W.

AU - Taylor, E. H.

PY - 1985/5/15

Y1 - 1985/5/15

N2 - Resonance Ionization Spectroscopy (RIS) is a sensitive and selective ionization technique capable of single atom detection. This technique has been applied to the trace element analysis of solids in a process called Sputter Initiated Resonance Ionization Spectroscopy (SIRIS). Here we briefly review RIS and SIRIS. Recent results are presented for measurements of boron concentrations down to the ppm level in standard steel and silicon samples. Some preliminary results are also presented for uranium and uranium compounds. A detection efficiency for SIRIS is reported which will make possible a sensitivity of 2 ppb.

AB - Resonance Ionization Spectroscopy (RIS) is a sensitive and selective ionization technique capable of single atom detection. This technique has been applied to the trace element analysis of solids in a process called Sputter Initiated Resonance Ionization Spectroscopy (SIRIS). Here we briefly review RIS and SIRIS. Recent results are presented for measurements of boron concentrations down to the ppm level in standard steel and silicon samples. Some preliminary results are also presented for uranium and uranium compounds. A detection efficiency for SIRIS is reported which will make possible a sensitivity of 2 ppb.

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SN - 0168-583X

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JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - PART 1

ER -

Materials analysis using sputter initiated resonance ionization spectroscopy

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