Material Thickness Reconstructions with X-ray and Neutron Radiography

Andrew J. Gilbert; Luke A. Campbell; Nikhil Deshmukh; Paul A. Hausladen; Paul B. Rose

doi:10.1109/NSS/MIC44845.2022.10399170

Material Thickness Reconstructions with X-ray and Neutron Radiography

Andrew J. Gilbert, Luke A. Campbell, Nikhil Deshmukh, Paul A. Hausladen, Paul B. Rose

Radiation Imaging and Advanced Diagnosti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Radiography is a powerful tool to determine the interior structure of objects. X-ray radiography is widely used and provides high-resolution images, though X-rays have limited transmission through materials of high atomic number (Z) and density. In contrast, neutron radiography can penetrate many materials that are heavily attenuating to X-rays, such as metals, providing contrast in the inner layers of highly attenuating items. Past work has shown the value in using both X-ray and neutron radiography for estimating material thicknesses, though this work was limited to simulated data. Here, we demonstrate material thickness reconstructions using experimental X-ray and neutron radiography data from lab-based systems, estimating material slab thicknesses to within 10%.

Original language	English
Title of host publication	2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665488723
DOIs	https://doi.org/10.1109/NSS/MIC44845.2022.10399170
State	Published - 2022
Event	2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022 - Milano, Italy Duration: Nov 5 2022 → Nov 12 2022

Publication series

Name	2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference

Conference

Conference	2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022
Country/Territory	Italy
City	Milano
Period	11/5/22 → 11/12/22

Funding

This work was funded by the US Department of Energy, National Nuclear Security Administration, Defense Nuclear Nonproliferation R&D. The document release number for this publication is PNNL-SA-172901. A.J.G. – telephone: 509-375-2922, email: [email protected] A. J. Gilbert, L. A. Campbell, and N. Deshmukh are with the Pacific Northwest National Laboratory, Richland, WA, USA. P. A. Hausladen and P. B. Rose are with the Oak Ridge National Laboratory, Oak Ridge, TN, USA.

Funders	Funder number
Defense Nuclear Nonproliferation R&D
U.S. Department of Energy
National Nuclear Security Administration

Keywords

material quantification
radiography

Access to Document

10.1109/NSS/MIC44845.2022.10399170

Cite this

Gilbert, A. J., Campbell, L. A., Deshmukh, N., Hausladen, P. A., & Rose, P. B. (2022). Material Thickness Reconstructions with X-ray and Neutron Radiography. In 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference (2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSS/MIC44845.2022.10399170

Gilbert, Andrew J. ; Campbell, Luke A. ; Deshmukh, Nikhil et al. / Material Thickness Reconstructions with X-ray and Neutron Radiography. 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference. Institute of Electrical and Electronics Engineers Inc., 2022. (2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference).

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abstract = "Radiography is a powerful tool to determine the interior structure of objects. X-ray radiography is widely used and provides high-resolution images, though X-rays have limited transmission through materials of high atomic number (Z) and density. In contrast, neutron radiography can penetrate many materials that are heavily attenuating to X-rays, such as metals, providing contrast in the inner layers of highly attenuating items. Past work has shown the value in using both X-ray and neutron radiography for estimating material thicknesses, though this work was limited to simulated data. Here, we demonstrate material thickness reconstructions using experimental X-ray and neutron radiography data from lab-based systems, estimating material slab thicknesses to within 10%.",

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year = "2022",

doi = "10.1109/NSS/MIC44845.2022.10399170",

language = "English",

series = "2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference",

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Gilbert, AJ, Campbell, LA, Deshmukh, N, Hausladen, PA & Rose, PB 2022, Material Thickness Reconstructions with X-ray and Neutron Radiography. in 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference. 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference, Institute of Electrical and Electronics Engineers Inc., 2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022, Milano, Italy, 11/5/22. https://doi.org/10.1109/NSS/MIC44845.2022.10399170

Material Thickness Reconstructions with X-ray and Neutron Radiography. / Gilbert, Andrew J.; Campbell, Luke A.; Deshmukh, Nikhil et al.
2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference. Institute of Electrical and Electronics Engineers Inc., 2022. (2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Rose, Paul B.

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AB - Radiography is a powerful tool to determine the interior structure of objects. X-ray radiography is widely used and provides high-resolution images, though X-rays have limited transmission through materials of high atomic number (Z) and density. In contrast, neutron radiography can penetrate many materials that are heavily attenuating to X-rays, such as metals, providing contrast in the inner layers of highly attenuating items. Past work has shown the value in using both X-ray and neutron radiography for estimating material thicknesses, though this work was limited to simulated data. Here, we demonstrate material thickness reconstructions using experimental X-ray and neutron radiography data from lab-based systems, estimating material slab thicknesses to within 10%.

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Gilbert AJ, Campbell LA, Deshmukh N, Hausladen PA , Rose PB. Material Thickness Reconstructions with X-ray and Neutron Radiography. In 2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference. Institute of Electrical and Electronics Engineers Inc. 2022. (2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference). doi: 10.1109/NSS/MIC44845.2022.10399170

Material Thickness Reconstructions with X-ray and Neutron Radiography

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Keywords

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