Original language | English |
---|---|
Pages (from-to) | 1048-1049 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 15 |
Issue number | SUPPL. 2 |
DOIs | |
State | Published - Jul 2009 |
Externally published | Yes |
Funding
References [1] J. Kuzmík, IEEE Electron Device Lett. 22, (2001) 510. [2] M. Gonschorek, et. al., Appl. Phys. Lett. 89, 062106 (2006). [3] L. Zhou, et. al., Appl. Phys. Lett. submitted. [4] M. Gonschorek, et. al., J. Appl. Phys. 103, (2008) 093714. [5] This work was supported by a contract from Wright Patterson Air Force Base (Monitor: C. Bozada) and the Swiss National Science Foundation (Contract No. 200021-107642/1). We acknowledge use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.
Funders | Funder number |
---|---|
Wright Patterson Air Force Base | |
Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung | 200021-107642/1 |