Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

F. Griggio; S. Jesse; A. Kumar; D. M. Marincel; D. S. Tinberg; S. V. Kalinin; S. Trolier-Mckinstry

doi:10.1063/1.3593138

Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

F. Griggio, S. Jesse, A. Kumar, D. M. Marincel, D. S. Tinberg, S. V. Kalinin, S. Trolier-Mckinstry

Center for Nanophase Matls Sciences

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

Original language	English
Article number	212901
Journal	Applied Physics Letters
Volume	98
Issue number	21
DOIs	https://doi.org/10.1063/1.3593138
State	Published - May 23 2011

Funding

Support for this work was provided in part by the National Security Science and Engineering Faculty Fellowship and by CNMS user Proposal No. CNMS2010-090 (F.G. and S.T.M.). A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Office of Basic Energy Sciences, U.S. Department of Energy under contract DE-AC05-00OR22725. Thanks to Oleg Ovchinnikov for useful discussions on MATLAB coding.

Funders	Funder number
National Security Science and Engineering	CNMS2010-090
U.S. Department of Energy	DE-AC05-00OR22725
Basic Energy Sciences
Oak Ridge National Laboratory

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@article{e30abd593be244cc8812ba1eb88fe6fb,

title = "Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy",

abstract = "Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.",

author = "F. Griggio and S. Jesse and A. Kumar and Marincel, {D. M.} and Tinberg, {D. S.} and Kalinin, {S. V.} and S. Trolier-Mckinstry",

year = "2011",

month = may,

day = "23",

doi = "10.1063/1.3593138",

language = "English",

volume = "98",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "21",

}

TY - JOUR

T1 - Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

AU - Griggio, F.

AU - Jesse, S.

AU - Kumar, A.

AU - Marincel, D. M.

AU - Tinberg, D. S.

AU - Kalinin, S. V.

AU - Trolier-Mckinstry, S.

PY - 2011/5/23

Y1 - 2011/5/23

N2 - Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

AB - Band excitation piezoresponse force microscopy enables local investigation of the nonlinear piezoelectric behavior of ferroelectric thin films. However, the presence of additional nonlinearity associated with the dynamic resonant response of the tip-surface junction can complicate the study of a material's nonlinearity. Here, the relative importance of the two nonlinearity sources was examined as a function of the excitation function. It was found that in order to minimize the effects of nonlinear tip-surface interactions but achieve good signal to noise level, an optimal excitation function must be used.

UR - http://www.scopus.com/inward/record.url?scp=79959401379&partnerID=8YFLogxK

U2 - 10.1063/1.3593138

DO - 10.1063/1.3593138

M3 - Article

AN - SCOPUS:79959401379

SN - 0003-6951

VL - 98

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 21

M1 - 212901

ER -

Mapping piezoelectric nonlinearity in the Rayleigh regime using band excitation piezoresponse force microscopy

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