Magnetic field orientation dependence of flux pinning in (Gd,Y)Ba2Cu3O7-x coated conductor with tilted lattice and nanostructures

Y. Zhang, E. D. Specht, C. Cantoni, D. K. Christen, J. R. Thompson, J. W. Sinclair, A. Goyal, Y. L. Zuev, T. Aytug, M. P. Paranthaman, Y. Chen, V. Selvamanickam

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22 Scopus citations

Abstract

The dependence of the critical current density (Jc) on the orientation of an applied magnetic field was studied for a prototype (Gd,Y)Ba2Cu3O7-x (GdYBCO) coated conductor fabricated by MOCVD on an IBAD-MgO template. Additional rare-earth cations (Y and Gd) and Zr were incorporated into the superconducting film to form (Y,Gd)2O3 and BaZrO3 nanoparticles extended nearly parallel to the a-b planes and to the c-axis, respectively, to enhance the flux pinning. In-field measurement of Jc was carried out with electrical current flowing either along or perpendicular to the longitudinal axis of the tape, while a maximum Lorentz force configuration was always maintained. Details in the angular dependence of Jc were related to the unique structure of the film, specifically the tilt in the GdYBCO lattice and the tilts in the extended (Y,Gd)2O3 and BaZrO3 nanoparticles. XRD and TEM were used to study the structure of the coated conductor. The effect of the misalignment between the external field H and the internal field B on the angular dependence of Jc is discussed.

Original languageEnglish
Pages (from-to)2044-2051
Number of pages8
JournalPhysica C: Superconductivity and its Applications
Volume469
Issue number23-24
DOIs
StatePublished - Dec 1 2009

Funding

Research sponsored by the US Department of Energy – Office of Electricity Delivery and Energy Reliability, Superconductivity Program for Electric Power Systems under contract DE-AC05-00OR22725 with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC.

FundersFunder number
U.S. Department of EnergyDE-AC05-00OR22725
Oak Ridge National Laboratory

    Keywords

    • Anisotropy
    • Coated conductor
    • Critical current density
    • Extended nanoparticle defects
    • Flux pinning

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