Abstract
In this study, we report on the magnetic domain formation in ultrathin blanket films and patterned micro- and nanostructures of ferromagnetic (FM) La0.7Sr0.3MnO3 single-layers and antiferromagnetic (AF)/ferromagnetic LaFeO3/La0.7Sr0.3MnO3 bilayers, as investigated by soft x-ray photoemission electron microscopy. In single-layer La0.7Sr0.3MnO3, the domain size is significantly reduced compared to that found in thicker layers, and rectangular micromagnets display metastable multidomain states distinctly different from the flux-closure ground states commonly found in thicker elements. In the LaFeO3/La0.7Sr0.3MnO3 bilayers, complex multidomain patterns are observed for blanket films and patterned magnets with robust perpendicular (spin-flop) coupling between spins in the AF and FM layers. By thermal cycling of the sample through the La0.7Sr0.3MnO3 Curie temperature, we find that the native antiferromagnetic domain pattern of LaFeO3 pins the location of domain boundaries in the adjacent La0.7Sr0.3MnO3 layer.
Original language | English |
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Article number | 132402 |
Journal | Applied Physics Letters |
Volume | 113 |
Issue number | 13 |
DOIs | |
State | Published - Sep 24 2018 |
Funding
This research was undertaken with financial support from the Research Council of Norway under Grant No. 231290. Funding was also obtained from the Norwegian PhD Network on Nanotechnology for Microsystems (A.D.B.), which is sponsored by the Research Council of Norway, Division for Science, under Contract No. 221860/ F60. X-PEEM measurements were carried out in part on beamline 11.0.1.1, the Advanced Light Source, Lawrence Berkeley National Laboratory, and in part on the SIM beamline, the Swiss Light Source, Paul Scherrer Institute, Villigen. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, and the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. Nanoscale patterning was carried out at the Center for Nanophase Materials Sciences, which is a U.S. DOE Office of Science User Facility. This research was undertaken with financial support from the Research Council of Norway under Grant No. 231290. Funding was also obtained from the Norwegian PhD Network on Nanotechnology for Microsystems (A.D.B.), which is sponsored by the Research Council of Norway, Division for Science, under Contract No. 221860/F60. X-PEEM measurements were carried out in part on beamline 11.0.1.1, the Advanced Light Source, Lawrence Berkeley National Laboratory, and in part on the SIM beamline, the Swiss Light Source, Paul Scherrer Institute, Villigen. The Advanced Light Source is supported by the Director, Office of Science, Office of Basic Energy Sciences, and the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. Nanoscale patterning was carried out at the Center for Nanophase Materials Sciences, which is a U.S. DOE Office of Science User Facility.
Funders | Funder number |
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A.D.B. | |
Division for Science | 221860/ F60 |
U.S. Department of Energy | DE-AC02-05CH11231 |
Office of Science | |
Basic Energy Sciences | |
Lawrence Berkeley National Laboratory | |
The Research Council of Norway | 231290 |