Abstract
We report on a study of ferromagnetic semiconductor (Ga,Mn)As/(Al,Ga,Mn)As bilayers using magnetometry and polarized neutron reflectivity (PNR). From depth-resolved characterization of the magnetic structure obtained by PNR, we concluded that the (Ga,Mn)As and (Al,Ga,Mn)As layers have in-plane and perpendicular-to-plane magnetic easy axes, respectively, with weak interlayer coupling. Therefore, the layer magnetizations align perpendicular to each other under low magnetic fields and parallel at high fields.
Original language | English |
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Article number | 053913 |
Journal | Journal of Applied Physics |
Volume | 118 |
Issue number | 5 |
DOIs | |
State | Published - Aug 7 2015 |
Externally published | Yes |