Abstract
Thin films of lead zirconate titanate (PZT) were prepared using a modified sol-gel technique. The samples were annealed on a hotplate at 500 °C. The technique yields films crystallized into (111) textured perovskite. The ferroelectric properties of the best film gave a remnant polarization value of 20.0 μC/cm2 and coercive field of 44 kV/cm. The microstructure of the film was determined to be fine grained and columnar. Permittivity for the sample was determined to be 1100. Indications of factors influencing the lowering of crystallization temperatures were observed.
Original language | English |
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Pages | 223-226 |
Number of pages | 4 |
State | Published - 1996 |
Externally published | Yes |
Event | Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA Duration: Aug 18 1996 → Aug 21 1996 |
Conference
Conference | Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) |
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City | East Brunswick, NJ, USA |
Period | 08/18/96 → 08/21/96 |