Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations

S. M. Anton, C. D. Nugroho, J. S. Birenbaum, S. R. O'Kelley, V. Orlyanchik, A. F. Dove, G. A. Olson, Z. R. Yoscovits, J. N. Eckstein, D. J. Van Harlingen, John Clarke

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We demonstrate a spurious contribution to low-frequency critical current noise in Josephson junctions-normally attributed to charge trapping in the barrier-arising from temperature instabilities inherent in cryogenic systems. These temperature fluctuations modify the critical current via its temperature dependence. Cross-correlations between measured temperature and critical current noise in Al-AlOx-Al junctions show that, despite excellent temperature stability, temperature fluctuations induce observable critical current fluctuations. Particularly, because 1/f critical current noise has decreased with improved fabrication techniques in recent years, it is important to understand and eliminate this additional noise source.

Original languageEnglish
Article number092601
JournalApplied Physics Letters
Volume101
Issue number9
DOIs
StatePublished - Aug 27 2012
Externally publishedYes

Funding

This research was funded by the Office of the Director of National Intelligence (ODNI), Intelligence Advanced Research Projects Activity (IARPA), through the Army Research Office. All statements of fact, opinion, or conclusions contained herein are those of the authors and should not be construed as representing the official views or policies of IARPA, the ODNI, or the U.S. Government.

Fingerprint

Dive into the research topics of 'Low-frequency critical current noise in Josephson junctions induced by temperature fluctuations'. Together they form a unique fingerprint.

Cite this