Abstract
We demonstrate a simple technique for improved imaging of non-crystallographic, irradiation-induced defects in the transmission electron microscope (TEM). By Fourier filtering bright-field TEM images to isolate relatively low-frequency fluctuations in intensity, it is possible to better resolve defects such as cavities caused by He-ion irradiation of iron. This analysis can be done with basic TEM imaging and most image processing software. This technique requires minimal defocus and can eliminate contrast mechanisms on both longer and short length scales. The resulting images are sensitive to filtering parameters, but clearly reveal the size, density, and distribution of cavities when compared with standard imaging techniques.
| Original language | English |
|---|---|
| Article number | 103864 |
| Journal | Micron |
| Volume | 196-197 |
| DOIs | |
| State | Published - Sep 2025 |
Funding
This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Los Alamos National Laboratory, an affirmative action equal opportunity employer, is managed by Triad National Security, LLC for the U.S. Department of Energy’s NNSA , under contract 89233218CNA000001 . This work was supported by the United States Department of Energy through the Basic Energy Sciences grant number DE-SC0020314 and the United States Department of Defense through the Office of Naval Research grant number N00014-20-1-2788 . Additional support was provided by the United States Department of Energy Nuclear Energy University Program (NEUP) via grant DE-NE000883 . This work was supported by the United States Department of Energy through the Basic Energy Sciences grant number DE-SC0020314 and the United States Department of Defense through the Office of Naval Research grant number N00014-20-1-2788. Additional support was provided by the United States Department of Energy Nuclear Energy University Program (NEUP) via grant DE-NE000883. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Los Alamos National Laboratory, an affirmative action equal opportunity employer, is managed by Triad National Security, LLC for the U.S. Department of Energy's NNSA, under contract 89233218CNA000001.
Keywords
- Defect analysis
- Fourier filtering
- Irradiation damage
- Transmission electron microscopy
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