Abstract
The degree of information localization in elastic and inelastic scattering is examined in the context of imaging zone axis crystals in the aberration corrected STEM. We show that detector geometry is a critical factor in determining the localization, and compare a number of different geometries. Experimental core loss line traces demonstrate strong EELS localization at the titanium L-edge, even in the presence of dynamical elastic scattering.
| Original language | English |
|---|---|
| Pages (from-to) | 313-322 |
| Number of pages | 10 |
| Journal | Ultramicroscopy |
| Volume | 96 |
| Issue number | 3-4 |
| DOIs | |
| State | Published - Sep 2003 |
Funding
This research was supported by Oak Ridge National Laboratory, Division of Materials Sciences, US Department of Energy, under contract DE-AC05-00OR22725 managed by UT-Battelle, LLC, and by an appointment to the ORNL Postdoctoral Research Associates Program administered jointly by ORNL and ORISE.
| Funders | Funder number |
|---|---|
| Division of Materials Sciences | |
| U.S. Department of Energy | DE-AC05-00OR22725 |
| Oak Ridge National Laboratory | |
| Oak Ridge Institute for Science and Education | |
| UT-Battelle |
Keywords
- Aberration
- Coherence
- Cs-correction
- Delocalization
- EELS
- Localization
- STEM