Local origins of sensor activity in 1D oxide nanostructures: From spectromicroscopy to device

A. Kolmakov; U. Lanke; J. Shin; S. Jesse; S. V. Kalinin; R. Karam

doi:10.1109/ICSENS.2005.1597828

Local origins of sensor activity in 1D oxide nanostructures: From spectromicroscopy to device

A. Kolmakov, U. Lanke, J. Shin, S. Jesse, S. V. Kalinin, R. Karam

Center for Nanophase Matls Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

We have tested a range of imaging techniques to address local transport behavior in the working metal oxide nanostructure sensor. In particular, we were using Scanning Surface Potential Microscopy (SSPM) to dc potential distributions in an operating device. We also have successfully implemented of synchrotron radiation based photoelectron emission spectro-microscopy (PEEM) to explore submicron lateral compositional and electronic (work function) inhomogeneouty in individual nanowire sensor. These results open new avenue to visualize the adsorption / desorption phenomena on individual nanostructure both in real time and at nano- and mesoscopic level.

Original language	English
Title of host publication	Proceedings of the Fourth IEEE Conference on Sensors 2005
Pages	830-833
Number of pages	4
DOIs	https://doi.org/10.1109/ICSENS.2005.1597828
State	Published - 2005
Event	Fourth IEEE Conference on Sensors 2005 - Irvine, CA, United States Duration: Oct 31 2005 → Nov 3 2005

Publication series

Name	Proceedings of IEEE Sensors
Volume	2005

Conference

Conference	Fourth IEEE Conference on Sensors 2005
Country/Territory	United States
City	Irvine, CA
Period	10/31/05 → 11/3/05

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10.1109/ICSENS.2005.1597828

Cite this

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title = "Local origins of sensor activity in 1D oxide nanostructures: From spectromicroscopy to device",

abstract = "We have tested a range of imaging techniques to address local transport behavior in the working metal oxide nanostructure sensor. In particular, we were using Scanning Surface Potential Microscopy (SSPM) to dc potential distributions in an operating device. We also have successfully implemented of synchrotron radiation based photoelectron emission spectro-microscopy (PEEM) to explore submicron lateral compositional and electronic (work function) inhomogeneouty in individual nanowire sensor. These results open new avenue to visualize the adsorption / desorption phenomena on individual nanostructure both in real time and at nano- and mesoscopic level.",

author = "A. Kolmakov and U. Lanke and J. Shin and S. Jesse and Kalinin, {S. V.} and R. Karam",

year = "2005",

doi = "10.1109/ICSENS.2005.1597828",

language = "English",

isbn = "0780390563",

series = "Proceedings of IEEE Sensors",

pages = "830--833",

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note = "Fourth IEEE Conference on Sensors 2005 ; Conference date: 31-10-2005 Through 03-11-2005",

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Kolmakov, A, Lanke, U, Shin, J, Jesse, S, Kalinin, SV & Karam, R 2005, Local origins of sensor activity in 1D oxide nanostructures: From spectromicroscopy to device. in Proceedings of the Fourth IEEE Conference on Sensors 2005., 1597828, Proceedings of IEEE Sensors, vol. 2005, pp. 830-833, Fourth IEEE Conference on Sensors 2005, Irvine, CA, United States, 10/31/05. https://doi.org/10.1109/ICSENS.2005.1597828

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AU - Shin, J.

AU - Jesse, S.

AU - Kalinin, S. V.

AU - Karam, R.

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AB - We have tested a range of imaging techniques to address local transport behavior in the working metal oxide nanostructure sensor. In particular, we were using Scanning Surface Potential Microscopy (SSPM) to dc potential distributions in an operating device. We also have successfully implemented of synchrotron radiation based photoelectron emission spectro-microscopy (PEEM) to explore submicron lateral compositional and electronic (work function) inhomogeneouty in individual nanowire sensor. These results open new avenue to visualize the adsorption / desorption phenomena on individual nanostructure both in real time and at nano- and mesoscopic level.

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BT - Proceedings of the Fourth IEEE Conference on Sensors 2005

Y2 - 31 October 2005 through 3 November 2005

ER -

Local origins of sensor activity in 1D oxide nanostructures: From spectromicroscopy to device

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