Abstract
Polarization switching in polycrystalline ferroelectric capacitors is explored using piezoresponse force microscopy (PFM) based first-order reversal curve (FORC) measurements. The band excitation method facilitates decoupling the electromechanical responses from variations in surface elastic properties. A simulated annealing method is developed to estimate the Preisach densities from PFM FORC data. Microscopic and macroscopic Preisach densities are compared, illustrating good agreement between the two.
Original language | English |
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Article number | 112906 |
Journal | Applied Physics Letters |
Volume | 96 |
Issue number | 11 |
DOIs | |
State | Published - 2010 |
Funding
The research was sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. O.O. acknowledges the ORNL SULI Program. P.B., I.F., and S.T.M. gratefully recognize support from the Center for Dielectric Studies, a National Security Science and Engineering Faculty Fellowship, and the Royal Thai Government. S.V.K. is grateful for Asylum Research Corporation for providing the beta-site for the HV PFM module.
Funders | Funder number |
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National Security Science and Engineering | |
Royal Thai Government | |
Scientific User Facilities Division | |
U.S. Department of Energy | |
Basic Energy Sciences |