Liquid titanium solute diffusion measured by pulsed ion-beam melting

P. G. Sanders; M. O. Thompson; T. J. Renk; M. J. Aziz

doi:10.1007/s11661-001-0171-1

Liquid titanium solute diffusion measured by pulsed ion-beam melting

P. G. Sanders
, M. O. Thompson
, T. J. Renk
, M. J. Aziz

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9 × 10^-5 cm²/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.

Original language	English
Article number	171
Pages (from-to)	2969-2974
Number of pages	6
Journal	Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Volume	32
Issue number	12
DOIs	https://doi.org/10.1007/s11661-001-0171-1
State	Published - 2001
Externally published	Yes

Funding

This research was sponsored by NASA Grant No. NAG8-1256 at Harvard University, CGS at Cornell University, and United States Department of Energy Contract No. DE-AC04-94AL85000 at Sandia National Laboratories. Ion implantation was performed in the Surface Modification and Characterization Research Center, Oak Ridge National Laboratory. TEM sample preparation and observations were assisted by W.A. Chu in the Department of Materials Science and Engineering at Northwestern University.

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10.1007/s11661-001-0171-1

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abstract = "The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9 × 10-5 cm2/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.",

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AU - Sanders, P. G.

AU - Thompson, M. O.

AU - Renk, T. J.

AU - Aziz, M. J.

PY - 2001

Y1 - 2001

N2 - The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9 × 10-5 cm2/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.

AB - The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9 × 10-5 cm2/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.

UR - https://www.scopus.com/pages/publications/0035716734

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JO - Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

JF - Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

IS - 12

M1 - 171

ER -

Liquid titanium solute diffusion measured by pulsed ion-beam melting

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