LIGHT EMISSION FROM METAL-INSULATOR-METAL STRUCTURES BIASED NEAR BREAKDOWN VOLTAGES.

M. J. Bloemer; J. P. Goudonnet; D. R. James; R. J. Warmack; T. L. Ferrell; E. T. Arakawa; T. A. Callcott

LIGHT EMISSION FROM METAL-INSULATOR-METAL STRUCTURES BIASED NEAR BREAKDOWN VOLTAGES.

M. J. Bloemer, J. P. Goudonnet, D. R. James, R. J. Warmack, T. L. Ferrell, E. T. Arakawa, T. A. Callcott

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

Optical emission is observed at prebreakdown voltages in thin-film metal-insulator-metal (MIM) structures. Subsequent examination of the junction in a scanning electron microscope reveals filamentary growth through the insulator. These tunnnel junctions consist of Al-Al//2O//3// minus Ag or Al-Al//2O//3// minus Au with a variety of microstructures incorporated in the junction. The emission spectrum is found to be dependent on the geometry of the MIM structure. Comparison of theory and experiment suggests that the emission results from the radiative decay of collective electronic excitations (surface plasmons) initiated by electrons tunneling through the insulator.

Original language	English
Pages (from-to)	335-338
Number of pages	4
Journal	Conference Record of IEEE International Symposium on Electrical Insulation
State	Published - 1986
Externally published	Yes

Cite this

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title = "LIGHT EMISSION FROM METAL-INSULATOR-METAL STRUCTURES BIASED NEAR BREAKDOWN VOLTAGES.",

abstract = "Optical emission is observed at prebreakdown voltages in thin-film metal-insulator-metal (MIM) structures. Subsequent examination of the junction in a scanning electron microscope reveals filamentary growth through the insulator. These tunnnel junctions consist of Al-Al//2O//3// minus Ag or Al-Al//2O//3// minus Au with a variety of microstructures incorporated in the junction. The emission spectrum is found to be dependent on the geometry of the MIM structure. Comparison of theory and experiment suggests that the emission results from the radiative decay of collective electronic excitations (surface plasmons) initiated by electrons tunneling through the insulator.",

author = "Bloemer, {M. J.} and Goudonnet, {J. P.} and James, {D. R.} and Warmack, {R. J.} and Ferrell, {T. L.} and Arakawa, {E. T.} and Callcott, {T. A.}",

year = "1986",

language = "English",

pages = "335--338",

journal = "Conference Record of IEEE International Symposium on Electrical Insulation",

issn = "0164-2006",

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TY - JOUR

T1 - LIGHT EMISSION FROM METAL-INSULATOR-METAL STRUCTURES BIASED NEAR BREAKDOWN VOLTAGES.

AU - Bloemer, M. J.

AU - Goudonnet, J. P.

AU - James, D. R.

AU - Warmack, R. J.

AU - Ferrell, T. L.

AU - Arakawa, E. T.

AU - Callcott, T. A.

PY - 1986

Y1 - 1986

N2 - Optical emission is observed at prebreakdown voltages in thin-film metal-insulator-metal (MIM) structures. Subsequent examination of the junction in a scanning electron microscope reveals filamentary growth through the insulator. These tunnnel junctions consist of Al-Al//2O//3// minus Ag or Al-Al//2O//3// minus Au with a variety of microstructures incorporated in the junction. The emission spectrum is found to be dependent on the geometry of the MIM structure. Comparison of theory and experiment suggests that the emission results from the radiative decay of collective electronic excitations (surface plasmons) initiated by electrons tunneling through the insulator.

AB - Optical emission is observed at prebreakdown voltages in thin-film metal-insulator-metal (MIM) structures. Subsequent examination of the junction in a scanning electron microscope reveals filamentary growth through the insulator. These tunnnel junctions consist of Al-Al//2O//3// minus Ag or Al-Al//2O//3// minus Au with a variety of microstructures incorporated in the junction. The emission spectrum is found to be dependent on the geometry of the MIM structure. Comparison of theory and experiment suggests that the emission results from the radiative decay of collective electronic excitations (surface plasmons) initiated by electrons tunneling through the insulator.

UR - http://www.scopus.com/inward/record.url?scp=0022890875&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0022890875

SN - 0164-2006

SP - 335

EP - 338

JO - Conference Record of IEEE International Symposium on Electrical Insulation

JF - Conference Record of IEEE International Symposium on Electrical Insulation

ER -

LIGHT EMISSION FROM METAL-INSULATOR-METAL STRUCTURES BIASED NEAR BREAKDOWN VOLTAGES.

Abstract

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