TY - GEN
T1 - Laser ultrasonic assessment of the effects of oxidation and microcracking on the elastic moduli of nuclear graphites
AU - Spicer, James
AU - Zeng, Fan
AU - Gallego, Nidia
AU - Contescu, Cristian
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/10/31
Y1 - 2017/10/31
N2 - Structure-property relationships in bulk materials can be important in establishing sensing methods to assess the state of material microstructure. This is particularly true for nuclear graphites since these materials can become oxidized under service conditions and the structural integrity must be confirmed during the lifetime of the material to ensure proper functioning of the reactor core. Many sensing methods might be used to assess the state of these materials, but the elastic moduli are among the physical properties that can be used to infer changes to graphite microstructure that are closely associated with loss of strength. In this work, laser ultrasonic methods were used to measure the elastic response of various graphite grades with a focus on NBG-18, NBG-25 and IG-110.
AB - Structure-property relationships in bulk materials can be important in establishing sensing methods to assess the state of material microstructure. This is particularly true for nuclear graphites since these materials can become oxidized under service conditions and the structural integrity must be confirmed during the lifetime of the material to ensure proper functioning of the reactor core. Many sensing methods might be used to assess the state of these materials, but the elastic moduli are among the physical properties that can be used to infer changes to graphite microstructure that are closely associated with loss of strength. In this work, laser ultrasonic methods were used to measure the elastic response of various graphite grades with a focus on NBG-18, NBG-25 and IG-110.
UR - http://www.scopus.com/inward/record.url?scp=85039451416&partnerID=8YFLogxK
U2 - 10.1109/ULTSYM.2017.8092371
DO - 10.1109/ULTSYM.2017.8092371
M3 - Conference contribution
AN - SCOPUS:85039451416
T3 - IEEE International Ultrasonics Symposium, IUS
BT - 2017 IEEE International Ultrasonics Symposium, IUS 2017
PB - IEEE Computer Society
T2 - 2017 IEEE International Ultrasonics Symposium, IUS 2017
Y2 - 6 September 2017 through 9 September 2017
ER -