Abstract
We report the first observation of efficient negative ion formation in excimer-laser irradiated benzene and toluene. These negative ions were formed via enhanced electron attachment to highly-excited states produced by the laser radiation. The potential of this technique as an analytical tool is discussed. Due to the general nature of the enhanced electron attachment mechanism involved, this technique can be expected to be applicable for a wide variety of molecules. (C) 1999 Elsevier Science B.V.
| Original language | English |
|---|---|
| Pages (from-to) | 77-86 |
| Number of pages | 10 |
| Journal | International Journal of Mass Spectrometry |
| Volume | 193 |
| Issue number | 1 |
| DOIs | |
| State | Published - Oct 28 1999 |
Funding
This research is supported by the Environmental Management Science Program (EMSP) of the Department of Energy through grants to the University of Tennessee, Knoxville, and the Oak Ridge National Laboratory. The authors thank Dr. R.T. Short at the Center for Ocean Technology, University of South Florida for designing the ion extraction lens. Two of the authors (K.N. and Y.Z.) are supported by the Oak Ridge National Laboratory (ORNL) Postdoctoral Research Associates Program administered jointly by ORNL and the Oak Ridge Institute for Science and Education. The Oak Ridge National Laboratory is managed by Lockheed Martin Energy Research Corp. for the U.S. Department of Energy under contract no. DE-AC05-96OR22464.
| Funders | Funder number |
|---|---|
| Lockheed Martin Energy Research Corp. | |
| U.S. Department of Energy | |
| Oak Ridge National Laboratory | |
| Oak Ridge Institute for Science and Education | |
| University of Tennessee |
Keywords
- Electron attachment
- Laser
- Mass spectrometry
- Negative ions
- Rydberg states