Lanthanum zirconate: A single buffer layer processed by solution deposition for coated conductor fabrication

S. Sathyamurthy; M. Paranthaman; H. Y. Zhai; H. M. Christen; P. M. Martin; A. Goyal

doi:10.1557/JMR.2002.0319

Lanthanum zirconate: A single buffer layer processed by solution deposition for coated conductor fabrication

S. Sathyamurthy, M. Paranthaman, H. Y. Zhai, H. M. Christen, P. M. Martin, A. Goyal

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

Abstract

A single layer of La₂Zr₂O₇ (LZO), deposited on textured Ni and Ni-1.7% Fe-3% W (Ni-W) tapes by a low-cost sol-gel process, is used as buffer layer for the growth of YBa₂Cu₃O_7-δ (YBCO) coated conductors. It is shown for the first time that such single buffer layers can be used for the deposition of YBCO yielding critical current densities (J_c) that are comparable to those typically obtained using CeO₂/YSZ/Y₂O₃ trilayers on identical substrates, i.e., in excess of 1 MA/cm² at 77 K and self-field. The properties of the YBCO films and the dependence of J_c on thickness of the LZO layer are investigated.

Original language	English
Pages (from-to)	2181-2184
Number of pages	4
Journal	Journal of Materials Research
Volume	17
Issue number	9
DOIs	https://doi.org/10.1557/JMR.2002.0319
State	Published - Sep 2002

Funding

The United States Department of Energy, Division of Materials Sciences, Office of Science and Office of Power Technologies-Superconductivity Program and Office of Energy Efficiency and Renewable Energy sponsored this research. This research was performed at the Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. DOE under Contract DE-AC05-00OR22725. Sincere acknowledgments are also extended to Oak Ridge Associated Universities for making this work possible.

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@article{6d736c866b0646aeba66ee3ce9ebee3a,

title = "Lanthanum zirconate: A single buffer layer processed by solution deposition for coated conductor fabrication",

abstract = "A single layer of La2Zr2O7 (LZO), deposited on textured Ni and Ni-1.7% Fe-3% W (Ni-W) tapes by a low-cost sol-gel process, is used as buffer layer for the growth of YBa2Cu3O7-δ (YBCO) coated conductors. It is shown for the first time that such single buffer layers can be used for the deposition of YBCO yielding critical current densities (Jc) that are comparable to those typically obtained using CeO2/YSZ/Y2O3 trilayers on identical substrates, i.e., in excess of 1 MA/cm2 at 77 K and self-field. The properties of the YBCO films and the dependence of Jc on thickness of the LZO layer are investigated.",

author = "S. Sathyamurthy and M. Paranthaman and Zhai, {H. Y.} and Christen, {H. M.} and Martin, {P. M.} and A. Goyal",

year = "2002",

month = sep,

doi = "10.1557/JMR.2002.0319",

language = "English",

volume = "17",

pages = "2181--2184",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Springer",

number = "9",

}

TY - JOUR

T1 - Lanthanum zirconate

T2 - A single buffer layer processed by solution deposition for coated conductor fabrication

AU - Sathyamurthy, S.

AU - Paranthaman, M.

AU - Zhai, H. Y.

AU - Christen, H. M.

AU - Martin, P. M.

AU - Goyal, A.

PY - 2002/9

Y1 - 2002/9

N2 - A single layer of La2Zr2O7 (LZO), deposited on textured Ni and Ni-1.7% Fe-3% W (Ni-W) tapes by a low-cost sol-gel process, is used as buffer layer for the growth of YBa2Cu3O7-δ (YBCO) coated conductors. It is shown for the first time that such single buffer layers can be used for the deposition of YBCO yielding critical current densities (Jc) that are comparable to those typically obtained using CeO2/YSZ/Y2O3 trilayers on identical substrates, i.e., in excess of 1 MA/cm2 at 77 K and self-field. The properties of the YBCO films and the dependence of Jc on thickness of the LZO layer are investigated.

AB - A single layer of La2Zr2O7 (LZO), deposited on textured Ni and Ni-1.7% Fe-3% W (Ni-W) tapes by a low-cost sol-gel process, is used as buffer layer for the growth of YBa2Cu3O7-δ (YBCO) coated conductors. It is shown for the first time that such single buffer layers can be used for the deposition of YBCO yielding critical current densities (Jc) that are comparable to those typically obtained using CeO2/YSZ/Y2O3 trilayers on identical substrates, i.e., in excess of 1 MA/cm2 at 77 K and self-field. The properties of the YBCO films and the dependence of Jc on thickness of the LZO layer are investigated.

UR - http://www.scopus.com/inward/record.url?scp=0036709660&partnerID=8YFLogxK

U2 - 10.1557/JMR.2002.0319

DO - 10.1557/JMR.2002.0319

M3 - Article

AN - SCOPUS:0036709660

SN - 0884-2914

VL - 17

SP - 2181

EP - 2184

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 9

ER -

Lanthanum zirconate: A single buffer layer processed by solution deposition for coated conductor fabrication

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