Langmuir adsorption model to assess the impact of silane coupling on nano-dispersion of silica in SBR

  • Ugochukwu Okoli
  • , Kabir Rishi
  • , Vanessa Manrique
  • , James Grammens
  • , Lahari Pallerla
  • , Jianqi Wang
  • , Gregory Beaucage
  • , Michael Chauby
  • , Alex McGlasson
  • , Vishak Narayanan
  • , Yangyang Wang
  • , Jan Ilavsky

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Surface active agents are often used to improve dispersion of nanoparticles. Quantitative correlation between these surface-active molecules and nanoscale dispersion is absent from the literature partly because a quantitative measure of nanoscale dispersion does not exist. Recently, we have developed the Virial-van der Waals method to quantify dispersion in nanocomposites using virial coefficients. In this paper, the Langmuir adsorption model is used to quantify the influence of surface-active agents on nano-scale dispersion in terms of the effective second virial coefficient B2. The impact of silane coupling agent on the nano-dispersion and silica aggregate structure in precipitated silica/SBR nanocomposites is demonstrated. It is shown that the higher viscosity SBR matrix led to a greater silica aggregate structural breakup, while lower viscosity matrix improved surface silanization. The isomeric content of the SBR, which impacts the dielectric behavior, impacted whether the system could be modeled through a mean-field or specific interactions. We earlier showed that larger aggregates improve dispersion, and this is reaffirmed in these results. After account is made for aggregate size, nano-scale dispersion improves with the addition of silane coupling agent. The behavior is well modeled using Langmuir monolayer adsorption.

Original languageEnglish
Article number127659
JournalPolymer
Volume312
DOIs
StatePublished - Oct 24 2024

Funding

The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper. The authors declare the following financial interests/personal relationships which may be considered as potential competing interests:Gregory Beaucage reports financial support was provided by National Science Foundation. Gregory Beaucage reports financial support, equipment, drugs, or supplies, and statistical analysis were provided by US Department of Energy. If there are other authors, they declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.This work was supported by the National Science Foundation (NSF) through Grant Nos. CMMI-1635865 and CBET-2409292. V.M. J.G. and L.P. were supported by a Research Experience for Undergraduates supplemental grant No. CMMI-1761420 associated with grant No. CMMI-1635865. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science user facility at Argonne National Laboratory and is based on research supported by the U.S. DOE Office of Science-Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. The dielectric spectroscopy measurements were conducted as part of a user project at the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. We would also like to thank Necati Kaval at the University of Cincinnati for assisting with the FTIR measurements and Nathan Silvernail at PPG Industries for providing the precipitated silica grade for this study. This work was supported by the National Science Foundation (NSF) through Grant Nos. CMMI-1635865 and CBET-2409292. V.M., J.G. and L.P. were supported by a Research Experience for Undergraduates supplemental grant No. CMMI-1761420 associated with grant No. CMMI-1635865. The Advanced Photon Source (APS) is an Office of Science User facility operated for the U.S. DOE by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. The USAXS data were collected on the beamline 9-ID-C operated by Dr. Jan Ilavsky and Dr. Ivan Kuzmenko at the X-ray Science Division at APS. The dielectric spectroscopy measurements were conducted as part of a user project at the Center for Nanophase Materials Sciences (CNMS), which is a US Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. We would also like to thank Necati Kaval at the University of Cincinnati for assisting with the FTIR measurements and Nathan Silvernail at PPG Industries for providing the precipitated silica grade for this study.

Keywords

  • FTIR
  • Langmuir model. surface silane
  • Silane coupling
  • TESPT
  • Viscosity
  • X-ray scattering

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