Kinetics of hydrogen desorption from Si(100) and Si(111) surfaces following chemisorption of disilane and trisilane

J. W. Sharp, Gyula Eres

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

The kinetics of hydrogen desorption from Si(100) and Si(111) surfaces during epitaxial silicon thin film growth from disilane and trisilane was investigated using differential surface reflectance. For both source molecules, first-order hydrogen desorption was observed from Si(100), and an intermediate reaction order was found on Si(111).

Original languageEnglish
Pages (from-to)169-173
Number of pages5
JournalSurface Science
Volume320
Issue number1-2
DOIs
StatePublished - 1994

Funding

Acknowledgements are directed to T.E. Haynes (RBS) and G.E. Jellison (ellipsometry) for measurements and analysis. This research was supported in part by an appointment to the Oak Ridge National Laboratory Postdoctoral Research Program administered by the Oak Ridge Institute for Science and Education.

FundersFunder number
Oak Ridge Institute for Science and Education

    Fingerprint

    Dive into the research topics of 'Kinetics of hydrogen desorption from Si(100) and Si(111) surfaces following chemisorption of disilane and trisilane'. Together they form a unique fingerprint.

    Cite this