Abstract
The kinetics of hydrogen desorption from Si(100) and Si(111) surfaces during epitaxial silicon thin film growth from disilane and trisilane was investigated using differential surface reflectance. For both source molecules, first-order hydrogen desorption was observed from Si(100), and an intermediate reaction order was found on Si(111).
Original language | English |
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Pages (from-to) | 169-173 |
Number of pages | 5 |
Journal | Surface Science |
Volume | 320 |
Issue number | 1-2 |
DOIs | |
State | Published - 1994 |
Funding
Acknowledgements are directed to T.E. Haynes (RBS) and G.E. Jellison (ellipsometry) for measurements and analysis. This research was supported in part by an appointment to the Oak Ridge National Laboratory Postdoctoral Research Program administered by the Oak Ridge Institute for Science and Education.
Funders | Funder number |
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Oak Ridge Institute for Science and Education |