TY - JOUR
T1 - Josephson junctions based on c-axis oriented YBaCuO/PrBaCuO/YBaCuO trilayers
AU - Ghyselen, B.
AU - Bari, M. A.
AU - Tarte, E. J.
AU - Blamire, M. G.
AU - Somekh, R. E.
AU - Yan, Y.
AU - Evetts, J. E.
PY - 1994/9/10
Y1 - 1994/9/10
N2 - We have fabricated sandwich SNS (superconductor/normal metal/superconductor) junctions using in-situ grown c-axis oriented YBaCuO/PrBaCuO/YBaCuO trilayers. We observe supercurrents for PrBaCuO thicknesses up to 130 nm at 4.2 K. To confirm or rule out the presence of shorts through the barrier, the junction behaviour has been further characterised. Magnetic-field and PrBaCuO thickness dependences of the critical current, as well as a correct scaling with the junction area of both the critical current and the normal resistance, appear to indicate a reasonable uniformity for the barriers on the scale of the size of the junctions, typically 10 μm. These results suggest that either we are observing real c-axis transport in PrBaCuO or, if the behaviour is defect dominated, that the criteria commonly used to demonstrate good device behaviour should be applied carefully. The temperature dependence of the junction critical current and normal resistance are also reported and compared.
AB - We have fabricated sandwich SNS (superconductor/normal metal/superconductor) junctions using in-situ grown c-axis oriented YBaCuO/PrBaCuO/YBaCuO trilayers. We observe supercurrents for PrBaCuO thicknesses up to 130 nm at 4.2 K. To confirm or rule out the presence of shorts through the barrier, the junction behaviour has been further characterised. Magnetic-field and PrBaCuO thickness dependences of the critical current, as well as a correct scaling with the junction area of both the critical current and the normal resistance, appear to indicate a reasonable uniformity for the barriers on the scale of the size of the junctions, typically 10 μm. These results suggest that either we are observing real c-axis transport in PrBaCuO or, if the behaviour is defect dominated, that the criteria commonly used to demonstrate good device behaviour should be applied carefully. The temperature dependence of the junction critical current and normal resistance are also reported and compared.
UR - http://www.scopus.com/inward/record.url?scp=0028496271&partnerID=8YFLogxK
U2 - 10.1016/0921-4534(94)90848-6
DO - 10.1016/0921-4534(94)90848-6
M3 - Article
AN - SCOPUS:0028496271
SN - 0921-4534
VL - 230
SP - 327
EP - 339
JO - Physica C: Superconductivity and its Applications
JF - Physica C: Superconductivity and its Applications
IS - 3-4
ER -