Abstract
A transmission electron microscopy sample preparation technique has been developed that would not damage or dissolve grain boundary phases. In this technique, phosphoric acid reveals grain boundaries that contain corrosive phases which are selectively extracted using a focused ion beam instrument. Regions with attacked boundaries are extracted by focused ion beam milling. The method has proven to be fast and reliable in preparing TEM foils for alloys containing grain boundary phases. It properly correlates and identifies grain boundary phases to the macroscopic intergranular corrosion behavior.
Original language | English |
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Pages | 42-43 |
Number of pages | 2 |
Volume | 166 |
No | 2 |
Specialist publication | Advanced Materials and Processes |
State | Published - Feb 2008 |
Externally published | Yes |