J CS in hts thick films: Influence of out-of-plane misorientation

J. Z. Wu; R. Emerge; X. Wang; D. Christen; T. Aytug; M. Paranthaman

J _CS in hts thick films: Influence of out-of-plane misorientation

J. Z. Wu, R. Emerge, X. Wang, D. Christen, T. Aytug, M. Paranthaman

Nanomaterials Chemistry Group

Research output: Contribution to conference › Paper › peer-review

Abstract

Epitaxy of thick (typically a few microns) high-T _c superconducting (HTS) films on metal substrates is desired for coated conductor (CC) applications. Despite the "typical" degradation of the critical current (J _c) at large film thickness on single crystal oxide substrates, thick film coated conductors suffer more significant J _c loss at comparable thickness. This motivated us to investigate effects of out-of-plane misorientations on the thickness dependence and depth profiles of J _cs. Single crystal SrTiO ₃ (STO) miscut substrates with different miscut angles of 5, 10 and 15 degrees were employed for controlling the out-of-plane misorientation. YBa ₂Cu ₃O ₇ (YBCO) films of different thickness up to 3.0 μm were fabricated on the miscut as well as flat STO substrates using pulsed laser deposition. Thickness dependence of J _cs was analyzed and interestingly, higher J _cs and a slower decrease of J _c with increasing thickness were observed on YBCO films on 5 and 10 degree miscut STO substrates at 77 K and self field. This seems contradict to what have been reported on HTSCC and suggests microstructure of the HTS films may play the key role in determining the J _c in thick HTS films.

Original language	English
Pages	313-322
Number of pages	10
State	Published - 2005
Event	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium - Orlando, FL, United States Duration: Oct 12 2003 → Oct 17 2003

Conference

Conference	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium
Country/Territory	United States
City	Orlando, FL
Period	10/12/03 → 10/17/03

Cite this

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title = "J CS in hts thick films: Influence of out-of-plane misorientation",

abstract = "Epitaxy of thick (typically a few microns) high-T c superconducting (HTS) films on metal substrates is desired for coated conductor (CC) applications. Despite the {"}typical{"} degradation of the critical current (J c) at large film thickness on single crystal oxide substrates, thick film coated conductors suffer more significant J c loss at comparable thickness. This motivated us to investigate effects of out-of-plane misorientations on the thickness dependence and depth profiles of J cs. Single crystal SrTiO 3 (STO) miscut substrates with different miscut angles of 5, 10 and 15 degrees were employed for controlling the out-of-plane misorientation. YBa 2Cu 3O 7 (YBCO) films of different thickness up to 3.0 μm were fabricated on the miscut as well as flat STO substrates using pulsed laser deposition. Thickness dependence of J cs was analyzed and interestingly, higher J cs and a slower decrease of J c with increasing thickness were observed on YBCO films on 5 and 10 degree miscut STO substrates at 77 K and self field. This seems contradict to what have been reported on HTSCC and suggests microstructure of the HTS films may play the key role in determining the J c in thick HTS films.",

author = "Wu, {J. Z.} and R. Emerge and X. Wang and D. Christen and T. Aytug and M. Paranthaman",

year = "2005",

language = "English",

pages = "313--322",

note = "Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium ; Conference date: 12-10-2003 Through 17-10-2003",

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T1 - J CS in hts thick films

T2 - Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium

AU - Wu, J. Z.

AU - Emerge, R.

AU - Wang, X.

AU - Christen, D.

AU - Aytug, T.

AU - Paranthaman, M.

PY - 2005

Y1 - 2005

N2 - Epitaxy of thick (typically a few microns) high-T c superconducting (HTS) films on metal substrates is desired for coated conductor (CC) applications. Despite the "typical" degradation of the critical current (J c) at large film thickness on single crystal oxide substrates, thick film coated conductors suffer more significant J c loss at comparable thickness. This motivated us to investigate effects of out-of-plane misorientations on the thickness dependence and depth profiles of J cs. Single crystal SrTiO 3 (STO) miscut substrates with different miscut angles of 5, 10 and 15 degrees were employed for controlling the out-of-plane misorientation. YBa 2Cu 3O 7 (YBCO) films of different thickness up to 3.0 μm were fabricated on the miscut as well as flat STO substrates using pulsed laser deposition. Thickness dependence of J cs was analyzed and interestingly, higher J cs and a slower decrease of J c with increasing thickness were observed on YBCO films on 5 and 10 degree miscut STO substrates at 77 K and self field. This seems contradict to what have been reported on HTSCC and suggests microstructure of the HTS films may play the key role in determining the J c in thick HTS films.

AB - Epitaxy of thick (typically a few microns) high-T c superconducting (HTS) films on metal substrates is desired for coated conductor (CC) applications. Despite the "typical" degradation of the critical current (J c) at large film thickness on single crystal oxide substrates, thick film coated conductors suffer more significant J c loss at comparable thickness. This motivated us to investigate effects of out-of-plane misorientations on the thickness dependence and depth profiles of J cs. Single crystal SrTiO 3 (STO) miscut substrates with different miscut angles of 5, 10 and 15 degrees were employed for controlling the out-of-plane misorientation. YBa 2Cu 3O 7 (YBCO) films of different thickness up to 3.0 μm were fabricated on the miscut as well as flat STO substrates using pulsed laser deposition. Thickness dependence of J cs was analyzed and interestingly, higher J cs and a slower decrease of J c with increasing thickness were observed on YBCO films on 5 and 10 degree miscut STO substrates at 77 K and self field. This seems contradict to what have been reported on HTSCC and suggests microstructure of the HTS films may play the key role in determining the J c in thick HTS films.

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M3 - Paper

AN - SCOPUS:28544449916

SP - 313

EP - 322

Y2 - 12 October 2003 through 17 October 2003

ER -

J _CS in hts thick films: Influence of out-of-plane misorientation

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