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Irradiation-induced creep in metallic nanolaminates characterized by In situ TEM pillar nanocompression

  • Shen J. Dillon
  • , Daniel C. Bufford
  • , Gowtham S. Jawaharram
  • , Xuying Liu
  • , Calvin Lear
  • , Khalid Hattar
  • , Robert S. Averback

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

This work reports on irradiation-induced creep (IIC) measured on nanolaminate (Cu-W and Ni-Ag) and nanocrystalline alloys (Cu-W) at room temperature using a combination of heavy ion irradiation and nanopillar compression performed concurrently in situ in a transmission electron microscope. Appreciable IIC is observed in multilayers with 50 nm layer thicknesses at high stress, ≈½ the yield strength, but not in multilayers with only 5 nm layer thicknesses.

Original languageEnglish
Pages (from-to)59-65
Number of pages7
JournalJournal of Nuclear Materials
Volume490
DOIs
StatePublished - Jul 1 2017
Externally publishedYes

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