Abstract
This document outlines the results obtained by Oak Ridge National Laboratory (ORNL) in collaboration with the University of Michigan-led Consolidated Innovative Nuclear Research project, “Feasibility of combined ion-neutron irradiation for accessing high dose levels.” In this reporting period, neutron irradiated were prepared and shipped to the University of Michigan for subsequent ion irradiation. The specimens were returned to ORNL’s Low Activation Materials Development and Analysis facility, prepared via focused ion beam for examination using scanning/transmission electron microscopy (S/TEM), and then examined using S/TEM to measure the as-irradiated microstructure. This report briefly summarizes the S/TEM results obtained at ORNL’s Low Activation Materials Development and Analysis facility.
Original language | English |
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Place of Publication | United States |
DOIs | |
State | Published - 2017 |
Keywords
- 73 NUCLEAR PHYSICS AND RADIATION PHYSICS
- NEUTRONS
- TRANSMISSION ELECTRON MICROSCOPY
- ELECTRONS
- IONS
- ION BEAMS