Abstract
MeV ions passing through polymer films modify their electrical and optical properties and these changes are related to changes in the chemical structures of the polymers. The effects of certain cross linking enhancers, such as sulfur and other pendant molecules, on the ion beam modification process were investigated. Stacked, thin films of polyethersulfone, polyvinyl chloride and polystyrene were bombarded with MeV helium ions and the induced changes in the chemical structure of the polymers were studied with Raman microprobe analysis and RBS combined with in situ residual gas analysis. FTIR spectroscopy was used to categorize the changes in the optical properties. The results were then compared with those from previously studied polyethylene and polyvinylidene chloride polymers.
Original language | English |
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Pages (from-to) | 1141-1145 |
Number of pages | 5 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 148 |
Issue number | 1-4 |
DOIs | |
State | Published - 1999 |
Funding
This project was supported by the Howard J. Foster Center for Irradiation of Materials at Alabama A&M University and Alabama-EPSCoR/ASIP Grant No. OSR-9559480. The work at ORNL was sponsored by the Division of Materials Sciences, US Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp.
Keywords
- Cross linking
- Ion beams
- Polymers
- Thin films