Ion beam milling of silicon carbide optical components

Kathy W. Hylton, Charles L. Carnal, J. R. Jackson, Charles M. Egert

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

Silicon carbide (SiC) is emerging as an important ceramic material for optical applications requiring stiff, lightweight structures with good thermal conductivity. This report discusses the application of ion milling in the fabrication of SiC optical components. Ion beam milling combined with either ductile grinding or polishing provides an excellent approach to deterministic fabrication of SiC optical components. Results of recent roughness evolution studies for SiC samples prepared by several pre-ion milling fabrication processes suggest that ductile grinding and some polishing processes can be used to produce low-subsurface-damage components suitable for ion milling. Typical improvements with optical figures after ion milling have convergences on the order of 2 or 3. Overall, these experiments indicate that ion milling combined with other fabrication processes represents a viable, highly deterministic approach to producing high-precision SiC optical components.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsVictor J. Doherty
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages16-26
Number of pages11
ISBN (Print)0819412430
StatePublished - 1994
EventAdvanced Optical Manufacturing and Testing IV - San Diego, CA, USA
Duration: Jul 15 1993Jul 16 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1994
ISSN (Print)0277-786X

Conference

ConferenceAdvanced Optical Manufacturing and Testing IV
CitySan Diego, CA, USA
Period07/15/9307/16/93

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