Investigations of the Weibull modulus as a function of stressing rate

M. J. Andrews, A. A. Wereszczak, K. Breder, M. K. Ferber, T. P. Kirkland

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations

Abstract

Experimental data for commercialized Si3N4 shows that surface flaws are more susceptible to slow crack growth (SCG) than volume flaws. Within a 95 percent confidence band, the Weibull modulus is significantly decreased for surface-induced failures as the stressing rate decreased. The volume-induced failures, which are less susceptible to SCG, shows no significant decrease in the Weibull modulus. As the stressing rate decreases, surface failures have greater influence in decreasing the Weibull modulus than volume failures.

Original languageEnglish
Pages (from-to)79-87
Number of pages9
JournalCeramic Engineering and Science Proceedings
Volume19
Issue number4
StatePublished - 1998
EventProceedings of the 1998 22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A. Part 1 (of 2) - Cocoa Beach, FL, USA
Duration: Jan 20 1998Jan 24 1998

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