Abstract
Experimental data for commercialized Si3N4 shows that surface flaws are more susceptible to slow crack growth (SCG) than volume flaws. Within a 95 percent confidence band, the Weibull modulus is significantly decreased for surface-induced failures as the stressing rate decreased. The volume-induced failures, which are less susceptible to SCG, shows no significant decrease in the Weibull modulus. As the stressing rate decreases, surface failures have greater influence in decreasing the Weibull modulus than volume failures.
Original language | English |
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Pages (from-to) | 79-87 |
Number of pages | 9 |
Journal | Ceramic Engineering and Science Proceedings |
Volume | 19 |
Issue number | 4 |
State | Published - 1998 |
Event | Proceedings of the 1998 22nd Annual Conference on Composites, Advanced Ceramics, Materials, and Structures: A. Part 1 (of 2) - Cocoa Beach, FL, USA Duration: Jan 20 1998 → Jan 24 1998 |