TY - GEN
T1 - Investigation of the kinetics of surface-limited thin film growth of SiGe alloys by CVD of Si2H6/Ge2H6 mixtures
AU - Sharp, J. W.
AU - Eres, Gyula
PY - 1993
Y1 - 1993
N2 - The kinetics of surface-limited thin film growth of SiGe alloys was investigated by time-resolved surface differential reflectometry. The source gas, mixtures of disilane and digermane in ratios from 1:1 to 6:1 in helium carrier gas, was delivered to a heated Si(001) substrate by a fast-acting pulsed molecular jet valve. The adsorption and desorption kinetics were determined from the surface differential reflectance signal obtained using a polarized, high-stability HeNe probe laser. Thin film growth was studied in the temperature range of 400-600 °C on Si(001) substrates. Preferential incorporation of digermane into the film produces an alloy composition that depends upon but does not mirror the gas composition. For all gas mixtures, there is a strong temperature dependence of the rate at which the adsorption layer decomposes into film plus by-product. The kinetic data and the alloy compositions provide a basis for deducing some of the characteristics of the reaction sequence that leads to SiGe alloy thin film growth.
AB - The kinetics of surface-limited thin film growth of SiGe alloys was investigated by time-resolved surface differential reflectometry. The source gas, mixtures of disilane and digermane in ratios from 1:1 to 6:1 in helium carrier gas, was delivered to a heated Si(001) substrate by a fast-acting pulsed molecular jet valve. The adsorption and desorption kinetics were determined from the surface differential reflectance signal obtained using a polarized, high-stability HeNe probe laser. Thin film growth was studied in the temperature range of 400-600 °C on Si(001) substrates. Preferential incorporation of digermane into the film produces an alloy composition that depends upon but does not mirror the gas composition. For all gas mixtures, there is a strong temperature dependence of the rate at which the adsorption layer decomposes into film plus by-product. The kinetic data and the alloy compositions provide a basis for deducing some of the characteristics of the reaction sequence that leads to SiGe alloy thin film growth.
UR - http://www.scopus.com/inward/record.url?scp=0027152565&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0027152565
SN - 1558991778
T3 - Materials Research Society Symposium Proceedings
SP - 433
EP - 438
BT - Chemical Perspectives of Microelectronic Materials III
PB - Publ by Materials Research Society
T2 - Proceedings of the 3rd Biennial Meeting of Chemical Perspectives of Microelectronic Materials
Y2 - 30 November 1992 through 3 December 1992
ER -