Investigation of the atomic structures of Si3N 4/CeO2-δ interfaces using atomic resolution Z-contrast imaging and EELS combined with first-principles methods

W. Walkosz; R. Klie; S. Öǧüt; A. Borisevich; P. Becher; S. J. Pennycook; J. C. Idrobo

doi:10.1017/S1431927608085668

Investigation of the atomic structures of Si₃N ₄/CeO_2-δ interfaces using atomic resolution Z-contrast imaging and EELS combined with first-principles methods

W. Walkosz, R. Klie, S. Öǧüt, A. Borisevich, P. Becher, S. J. Pennycook, J. C. Idrobo

electron Microscopy and Microanalysis

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1364-1365
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	14
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927608085668
State	Published - Aug 2008

Access to Document

10.1017/S1431927608085668

Cite this

@article{2bc74dfae10843df9433828a88429150,

title = "Investigation of the atomic structures of Si3N 4/CeO2-δ interfaces using atomic resolution Z-contrast imaging and EELS combined with first-principles methods",

author = "W. Walkosz and R. Klie and S. {\"O}ǧ{\"u}t and A. Borisevich and P. Becher and Pennycook, \{S. J.\} and Idrobo, \{J. C.\}",

year = "2008",

month = aug,

doi = "10.1017/S1431927608085668",

language = "English",

volume = "14",

pages = "1364--1365",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Investigation of the atomic structures of Si3N 4/CeO2-δ interfaces using atomic resolution Z-contrast imaging and EELS combined with first-principles methods

AU - Walkosz, W.

AU - Klie, R.

AU - Öǧüt, S.

AU - Borisevich, A.

AU - Becher, P.

AU - Pennycook, S. J.

AU - Idrobo, J. C.

PY - 2008/8

Y1 - 2008/8

UR - https://www.scopus.com/pages/publications/49549108898

U2 - 10.1017/S1431927608085668

DO - 10.1017/S1431927608085668

M3 - Article

AN - SCOPUS:49549108898

SN - 1431-9276

VL - 14

SP - 1364

EP - 1365

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Investigation of the atomic structures of Si3N 4/CeO2-δ interfaces using atomic resolution Z-contrast imaging and EELS combined with first-principles methods

Access to Document

Other files and links

Cite this

Investigation of the atomic structures of Si₃N ₄/CeO_2-δ interfaces using atomic resolution Z-contrast imaging and EELS combined with first-principles methods