Abstract
A specially designed semi-circular notch specimen was employed in the current study to generate the various strain conditions, including uniaxial, biaxial, shear, and plane strains, which was utilized to explore the evolution of different deformation twinning systems under complex loading conditions. Using in situ synchrotron X-ray diffraction mapping method, it was found that the extensive double twins were activated during loading, while nearly no extension twinning activity was detected. After the formation of {10.1} and {10.3} compression twins, they transformed into {10.1}-{10.2} and {10.3}-{10.2} double twins instantaneously at the early stage of deformation. The lattice strain evolutions in different hkls were mapped at selected load levels during the loading-unloading sequence. The relationship between the macroscopic straining and microscopic response was established.
Original language | English |
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Pages (from-to) | 619-633 |
Number of pages | 15 |
Journal | Journal of Alloys and Compounds |
Volume | 683 |
DOIs | |
State | Published - 2016 |
Funding
This research used resources at the Spallation Neutron Source (SNS), Oak Ridge National Laboratory (ORNL), supported by the U.S. Department of Energy , Basic Energy Sciences , Scientific User Facilities Division under Contract No. DE-AC05-00OR22725. W.W. is supported by a Laboratory Directed Research and Development (LDRD) project (LDRD-6789) of ORNL. The synchrotron X-ray diffraction work was carried out the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357 .
Funders | Funder number |
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Basic Energy Sciences , Scientific User Facilities Division | |
DOE Office of Science | |
U.S. Department of Energy | |
Office of Science | |
Argonne National Laboratory | |
Oak Ridge National Laboratory | |
Laboratory Directed Research and Development | LDRD-6789 |
Keywords
- Mechanical properties
- Metals and alloys
- Microstructure
- X-ray diffraction