Abstract
For high capacitance multilayer ceramic capacitors, high dielectric constant and lead-free ceramic nanoparticles are highly desired. However, as the particle size decreases to a few tens of nanometers, their dielectric constant significantly decreases, and the underlying mechanism has yet to be fully elucidated. Herein, we report a systematic investigation into the crystal structure-dielectric property relationship of combustion-made BaTiO3 (BTO) nanocrystals. When the nanocrystal size was 100 nm and below, a metastable paraelectric cubic phase was found in the as-received BTO (denoted as arBTO) nanocrystals based on an X-ray diffraction (XRD) study. A stable ferroelectric tetragonal phase was present when the nanocrystal size was above 200 nm. Notably, the cubic arBTO (particle size ≤100 nm) exhibited tetragonal fluctuations as revealed by Raman spectroscopy, whereas the tetragonal arBTO (particle size ≥200 nm) contained ∼10% cubic fraction according to the Rietveld fitting of the XRD profiles. Thermal annealing of the multi-grain tetragonal arBTO at 950 °C yielded single crystals of annealed BTO (denoted as anBTO), whose dielectric constants were higher than those of arBTO. However, the single crystalline anBTO prevented the formation of 90° domains; therefore, they exhibited a low dielectric constant of ∼300. Although X-ray photoelectron spectroscopy and high-resolution transmission electron microscopy could not identify the exact structural defects, our study revealed that surface and bulk defects formed during synthesis affect the final crystal structures and thus the dielectric properties of BTO nanocrystals with different sizes. The understanding obtained from this study will help us design high dielectric constant perovskite nanocrystals for next-generation multilayer ceramic capacitor applications.
Original language | English |
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Pages (from-to) | 7829-7844 |
Number of pages | 16 |
Journal | Nanoscale |
Volume | 15 |
Issue number | 17 |
DOIs | |
State | Published - Mar 23 2023 |
Funding
L. Z. and Z. L. acknowledge the financial support from the NSF Division of Materials Research (DMR-1709420). The XRD study used the 11-BM CMS beamline of National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory (BNL), a U.S. Department of Energy (DOE) User Facility operated for the Office of Science by BNL under contract DE-SC0012704. Dr Robert E. A. Williams performed electron microscopy at the Center for Electron Microscopy and Analysis at the Ohio State University. Part of the FIB and TEM analyses was conducted at the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory (ORNL), which is a DOE Office of Science User Facility. The authors thank Dorothy Coffey at ORNL for FIB experiments and Xiang Cheng at Case Western Reserve University for the FTIR experiments.
Funders | Funder number |
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Xiang Cheng at Case Western Reserve University | |
U.S. Department of Energy | |
Division of Materials Research | DMR-1709420 |
Office of Science | DE-SC0012704 |
Oak Ridge National Laboratory | |
Brookhaven National Laboratory |